Single event effects hardening and characterization of honeywell's pass 3 RHPPC processor integrated circuit

We describe a single event effects evaluation of Honeywell's radiation-hardened Pass 3 RHPPC processor, which is functionally and pin-compatible with the commercial PowerPC 603e TM . Results support an upset rate of 1x10 -5 upsets/chip-day in geosynchronous orbit.

Saved in:
Bibliographic Details
Main Authors: Lintz, John. P., Hoffmann, Lee. F., Smith, Matthew. J., van Cleave, Russell. T., Cizmarik, Ryan. R.
Format: Conference Proceeding
Language:English
Subjects:
Built-in self-test
Clocks
Cyclotrons
Electronics packaging
Microprocessors
Protons
Registers
Silicon on insulator technology
Single event upset
Testing
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We describe a single event effects evaluation of Honeywell's radiation-hardened Pass 3 RHPPC processor, which is functionally and pin-compatible with the commercial PowerPC 603e TM . Results support an upset rate of 1x10 -5 upsets/chip-day in geosynchronous orbit.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2007.4342558