Managing thermal effects in eclipse Z-scan technique

In this paper, we introduce a new combination of the eclipse Z-scan with the recently introduced thermally managed Z-scan, that gains in sensitivity associated with the simultaneous measurement of the thermal and nonthermal contributions to the nonlinear (NL) refractive properties of photonic materi...

Full description

Saved in:
Bibliographic Details
Main Authors: Gomes, A.S.L., Filho, E.L. Falcao, de Araujo, Cid B., Rativa, Diego, de Araujo, R.E.
Format: Conference Proceeding
Language:English
Subjects:
Amino acids
Choppers
Distortion measurement
Evolution (biology)
Iron
Optical materials
Optimized production technology
Refractive index
Thermal management
Thermal management of electronics
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 1
container_issue
container_start_page 1
container_title
container_volume
creator Gomes, A.S.L.
Filho, E.L. Falcao
de Araujo, Cid B.
Rativa, Diego
de Araujo, R.E.
description In this paper, we introduce a new combination of the eclipse Z-scan with the recently introduced thermally managed Z-scan, that gains in sensitivity associated with the simultaneous measurement of the thermal and nonthermal contributions to the nonlinear (NL) refractive properties of photonic materials using relatively low laser intensities.
doi_str_mv 10.1109/CLEOE-IQEC.2007.4386149
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4386149</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4386149</ieee_id><sourcerecordid>4386149</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-a476410f86bb27d9600a0b9ea037594422df4661241466504340c4335005ca0f3</originalsourceid><addsrcrecordid>eNo1j8FKw0AURUdEUGu-wIXzA4nvzbxMMksJUQuRInTlpkymb9qRNNRMXPj3Fqyrw92cyxHiAaFABPvYdO2qzZfvbVMogKogXRskeyFukRQRWI10KTJb1f8b9LXIUvoEAKwMAZY3gt7c6HZx3Ml5z9PBDZJDYD8nGUfJfojHxPIjT96Ncma_H-PXN9-Jq-CGxNmZC7F-btfNa96tXpbNU5dHC3Pu6HSCEGrT96raWgPgoLfsQFelJVJqG8gYVIQnlECawJPWJUDpHQS9EPd_2sjMm-MUD2762Zw79S9zqEUe</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Managing thermal effects in eclipse Z-scan technique</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Gomes, A.S.L. ; Filho, E.L. Falcao ; de Araujo, Cid B. ; Rativa, Diego ; de Araujo, R.E.</creator><creatorcontrib>Gomes, A.S.L. ; Filho, E.L. Falcao ; de Araujo, Cid B. ; Rativa, Diego ; de Araujo, R.E.</creatorcontrib><description>In this paper, we introduce a new combination of the eclipse Z-scan with the recently introduced thermally managed Z-scan, that gains in sensitivity associated with the simultaneous measurement of the thermal and nonthermal contributions to the nonlinear (NL) refractive properties of photonic materials using relatively low laser intensities.</description><identifier>ISBN: 9781424409303</identifier><identifier>ISBN: 1424409306</identifier><identifier>EISBN: 1424409314</identifier><identifier>EISBN: 9781424409310</identifier><identifier>DOI: 10.1109/CLEOE-IQEC.2007.4386149</identifier><language>eng</language><publisher>IEEE</publisher><subject>Amino acids ; Choppers ; Distortion measurement ; Evolution (biology) ; Iron ; Optical materials ; Optimized production technology ; Refractive index ; Thermal management ; Thermal management of electronics</subject><ispartof>2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, 2007, p.1-1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4386149$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2057,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4386149$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gomes, A.S.L.</creatorcontrib><creatorcontrib>Filho, E.L. Falcao</creatorcontrib><creatorcontrib>de Araujo, Cid B.</creatorcontrib><creatorcontrib>Rativa, Diego</creatorcontrib><creatorcontrib>de Araujo, R.E.</creatorcontrib><title>Managing thermal effects in eclipse Z-scan technique</title><title>2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference</title><addtitle>CLEOE-IQEC</addtitle><description>In this paper, we introduce a new combination of the eclipse Z-scan with the recently introduced thermally managed Z-scan, that gains in sensitivity associated with the simultaneous measurement of the thermal and nonthermal contributions to the nonlinear (NL) refractive properties of photonic materials using relatively low laser intensities.</description><subject>Amino acids</subject><subject>Choppers</subject><subject>Distortion measurement</subject><subject>Evolution (biology)</subject><subject>Iron</subject><subject>Optical materials</subject><subject>Optimized production technology</subject><subject>Refractive index</subject><subject>Thermal management</subject><subject>Thermal management of electronics</subject><isbn>9781424409303</isbn><isbn>1424409306</isbn><isbn>1424409314</isbn><isbn>9781424409310</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo1j8FKw0AURUdEUGu-wIXzA4nvzbxMMksJUQuRInTlpkymb9qRNNRMXPj3Fqyrw92cyxHiAaFABPvYdO2qzZfvbVMogKogXRskeyFukRQRWI10KTJb1f8b9LXIUvoEAKwMAZY3gt7c6HZx3Ml5z9PBDZJDYD8nGUfJfojHxPIjT96Ncma_H-PXN9-Jq-CGxNmZC7F-btfNa96tXpbNU5dHC3Pu6HSCEGrT96raWgPgoLfsQFelJVJqG8gYVIQnlECawJPWJUDpHQS9EPd_2sjMm-MUD2762Zw79S9zqEUe</recordid><startdate>200706</startdate><enddate>200706</enddate><creator>Gomes, A.S.L.</creator><creator>Filho, E.L. Falcao</creator><creator>de Araujo, Cid B.</creator><creator>Rativa, Diego</creator><creator>de Araujo, R.E.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200706</creationdate><title>Managing thermal effects in eclipse Z-scan technique</title><author>Gomes, A.S.L. ; Filho, E.L. Falcao ; de Araujo, Cid B. ; Rativa, Diego ; de Araujo, R.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-a476410f86bb27d9600a0b9ea037594422df4661241466504340c4335005ca0f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Amino acids</topic><topic>Choppers</topic><topic>Distortion measurement</topic><topic>Evolution (biology)</topic><topic>Iron</topic><topic>Optical materials</topic><topic>Optimized production technology</topic><topic>Refractive index</topic><topic>Thermal management</topic><topic>Thermal management of electronics</topic><toplevel>online_resources</toplevel><creatorcontrib>Gomes, A.S.L.</creatorcontrib><creatorcontrib>Filho, E.L. Falcao</creatorcontrib><creatorcontrib>de Araujo, Cid B.</creatorcontrib><creatorcontrib>Rativa, Diego</creatorcontrib><creatorcontrib>de Araujo, R.E.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gomes, A.S.L.</au><au>Filho, E.L. Falcao</au><au>de Araujo, Cid B.</au><au>Rativa, Diego</au><au>de Araujo, R.E.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Managing thermal effects in eclipse Z-scan technique</atitle><btitle>2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference</btitle><stitle>CLEOE-IQEC</stitle><date>2007-06</date><risdate>2007</risdate><spage>1</spage><epage>1</epage><pages>1-1</pages><isbn>9781424409303</isbn><isbn>1424409306</isbn><eisbn>1424409314</eisbn><eisbn>9781424409310</eisbn><abstract>In this paper, we introduce a new combination of the eclipse Z-scan with the recently introduced thermally managed Z-scan, that gains in sensitivity associated with the simultaneous measurement of the thermal and nonthermal contributions to the nonlinear (NL) refractive properties of photonic materials using relatively low laser intensities.</abstract><pub>IEEE</pub><doi>10.1109/CLEOE-IQEC.2007.4386149</doi><tpages>1</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 9781424409303
ispartof 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference, 2007, p.1-1
issn
language eng
recordid cdi_ieee_primary_4386149
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Amino acids
Choppers
Distortion measurement
Evolution (biology)
Iron
Optical materials
Optimized production technology
Refractive index
Thermal management
Thermal management of electronics
title Managing thermal effects in eclipse Z-scan technique
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T18%3A06%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Managing%20thermal%20effects%20in%20eclipse%20Z-scan%20technique&rft.btitle=2007%20European%20Conference%20on%20Lasers%20and%20Electro-Optics%20and%20the%20International%20Quantum%20Electronics%20Conference&rft.au=Gomes,%20A.S.L.&rft.date=2007-06&rft.spage=1&rft.epage=1&rft.pages=1-1&rft.isbn=9781424409303&rft.isbn_list=1424409306&rft_id=info:doi/10.1109/CLEOE-IQEC.2007.4386149&rft.eisbn=1424409314&rft.eisbn_list=9781424409310&rft_dat=%3Cieee_6IE%3E4386149%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-a476410f86bb27d9600a0b9ea037594422df4661241466504340c4335005ca0f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4386149&rfr_iscdi=true