Emission characteristics of high power LEDs studied by confocal microscopy

We have developed a method that allows us to measure the emission profiles of millimetre-sized high-power light emitting diodes with micron resolution. The optical cross-sections recorded provide detailed information on the light intensity distribution of LEDs within the substrate till a distance of...

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Bibliographic Details
Main Authors: Kuna, L., Sommer, C., Zinterl, E., Wenzl, F.P., Pachler, P., Hartmann, P., Tasch, S., Leising, G.
Format: Conference Proceeding
Language:English
Subjects:
Apertures
Gallium nitride
Lenses
Light emitting diodes
Microscopy
Optical distortion
Optical recording
Photonics
Semiconductor device measurement
Stimulated emission
Online Access:Request full text
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Summary:We have developed a method that allows us to measure the emission profiles of millimetre-sized high-power light emitting diodes with micron resolution. The optical cross-sections recorded provide detailed information on the light intensity distribution of LEDs within the substrate till a distance of several tens of millimetres, which can be used to map out strategies for an optimization of the power efficiency or the tailoring of the light distribution of high power LEDs.
DOI:10.1109/CLEOE-IQEC.2007.4386197