Material Characterization Improvement in High Temperature Rectangular Waveguide Measurements

The scattering parameters of a single-top gap partially filled rectangular waveguide (PFW) are calculated using mode-matching of the transverse fields. This is accomplished by including in the calculations the complex power contained in higher-order TM modes scattered by a material sample in the wav...

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Bibliographic Details
Main Authors: Buschelman, E.A., Havrilla, M.J., Terzuoli, A.J., Crittenden, P.E.
Format: Conference Proceeding
Language:English
Subjects:
Calibration
Electromagnetic scattering
Electromagnetic waveguides
Magnetic materials
Rectangular waveguides
Scattering parameters
Temperature measurement
Testing
Waveguide components
Waveguide discontinuities
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Description
Summary:The scattering parameters of a single-top gap partially filled rectangular waveguide (PFW) are calculated using mode-matching of the transverse fields. This is accomplished by including in the calculations the complex power contained in higher-order TM modes scattered by a material sample in the waveguide. Furthermore, use of the forward and reverse scattering parameters eliminates the dependence of the placement of the sample with respect to a reference or calibration plane. A combination of the higher-order mode-matching and the reference plane independent (RPI) technique provides the best method for overcoming errors associated with high temperature waveguide measurements. Experimental results are presented to validate the analysis.
DOI:10.1109/ICEAA.2007.4387304