Test Point Selections for a Programmable Gain Amplifier Using NIST and Wavelet Transform Methods

Test point selections for a programmable gain amplifier (PGA) using the National Institute of Standard (NIST) and wavelet transform methods are investigated. Although the wavelet transform method is an efficient method in test point selection for many mixed-signal devices, for a PGA with 31 input st...

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Bibliographic Details
Main Authors: Xinsong Zhang, Ang, S.S., Carter, C.
Format: Conference Proceeding
Language:English
Subjects:
Automatic testing
Circuit testing
Electronics packaging
Gain measurement
NIST
Performance gain
Predictive models
USA Councils
Voltage
Wavelet transforms
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Description
Summary:Test point selections for a programmable gain amplifier (PGA) using the National Institute of Standard (NIST) and wavelet transform methods are investigated. Although the wavelet transform method is an efficient method in test point selection for many mixed-signal devices, for a PGA with 31 input steps, the NIST method is shown to be more accurate in predicting the output gain responses than the wavelet transform method.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2007.28