An HDL-Based Platform for High Level NoC Switch Testing

This paper presents a non-scan method of NoC switch testing. The method requires addition of test-mode hardware for NoC switches and processing elements which is much less than what is required for most scan methods. Associated with our proposed test-mode of an NoC, we have developed a test environm...

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Bibliographic Details
Main Authors: Sedghi, M., Alaghi, A., Koopahi, E., Navabi, Z.
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit testing
Communication switching
Dictionaries
Hardware
Integrated circuit interconnections
Network-on-a-chip
Packet switching
Sequential analysis
Switches
Online Access:Request full text
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Description
Summary:This paper presents a non-scan method of NoC switch testing. The method requires addition of test-mode hardware for NoC switches and processing elements which is much less than what is required for most scan methods. Associated with our proposed test-mode of an NoC, we have developed a test environment based on high-level switch faults. The test environment applies test packets to the NoC-under-test in its test-mode and generates an NoC fault dictionary to be used for error detection of an NoC running in the test-mode. Proposed fault models and test strategy will be discussed in this paper.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2007.97