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A Completely Scalable Lumped-Circuit Model for Horizontal and Vertical HALL Devices
A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility eff...
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Main Authors: | , , , , |
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Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
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Summary: | A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results. |
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ISSN: | 1930-0395 2168-9229 |
DOI: | 10.1109/ICSENS.2007.4388404 |