A Completely Scalable Lumped-Circuit Model for Horizontal and Vertical HALL Devices

A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility eff...

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Main Authors: Dimitropoulos, P.D., Reymond, S., Drljaca, P.M., Popovic, R.S., Nastos, N.
Format: Conference Proceeding
Language:English
Subjects:
Computational modeling
Conductivity
Electronic design automation and methodology
Integral equations
Magnetic sensors
Magnetoresistance
Semiconductor device modeling
Sensor phenomena and characterization
Solid modeling
Temperature sensors
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creator Dimitropoulos, P.D.
Reymond, S.
Drljaca, P.M.
Popovic, R.S.
Nastos, N.
description A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results.
doi_str_mv 10.1109/ICSENS.2007.4388404
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4388404</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4388404</ieee_id><sourcerecordid>4388404</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-31e6cf73a384cc4134c61bdf975e33b2bf617c3c45734ba9335c5f5c497e3083</originalsourceid><addsrcrecordid>eNo1kMtuwjAURN2XVKB8ARv_QFLb147tJUqhIKXtIqhb5Dg3kiuHoCRUol9fpNLVLEZndDSELDhLOWf2eZuXq_cyFYzpVIIxkskbMrfacCmk5CIT8pZMBM9MYoWwd2T6X3B9TybcAksYWPVIpsPwxZhgSpgJKZc079pjxBHjmZbeRVdFpMWpPWKd5KH3pzDSt67GSJuup5uuDz_dYXSRukNNP7EfwwWim2VR0Bf8Dh6HJ_LQuDjg_JozsluvdvkmKT5et_mySALXakyAY-YbDQ6M9F5ykD7jVd1YrRCgElVzUffgpdIgK2cBlFeN8tJqBGZgRhZ_swER98c-tK4_76_fwC_bB1NE</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A Completely Scalable Lumped-Circuit Model for Horizontal and Vertical HALL Devices</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Dimitropoulos, P.D. ; Reymond, S. ; Drljaca, P.M. ; Popovic, R.S. ; Nastos, N.</creator><creatorcontrib>Dimitropoulos, P.D. ; Reymond, S. ; Drljaca, P.M. ; Popovic, R.S. ; Nastos, N.</creatorcontrib><description>A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results.</description><identifier>ISSN: 1930-0395</identifier><identifier>ISBN: 1424412617</identifier><identifier>ISBN: 9781424412617</identifier><identifier>EISSN: 2168-9229</identifier><identifier>EISBN: 9781424412624</identifier><identifier>EISBN: 1424412625</identifier><identifier>DOI: 10.1109/ICSENS.2007.4388404</identifier><language>eng</language><publisher>IEEE</publisher><subject>Computational modeling ; Conductivity ; Electronic design automation and methodology ; Integral equations ; Magnetic sensors ; Magnetoresistance ; Semiconductor device modeling ; Sensor phenomena and characterization ; Solid modeling ; Temperature sensors</subject><ispartof>2007 IEEE Sensors, 2007, p.337-340</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4388404$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,2053,27907,54537,54902,54914</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4388404$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Dimitropoulos, P.D.</creatorcontrib><creatorcontrib>Reymond, S.</creatorcontrib><creatorcontrib>Drljaca, P.M.</creatorcontrib><creatorcontrib>Popovic, R.S.</creatorcontrib><creatorcontrib>Nastos, N.</creatorcontrib><title>A Completely Scalable Lumped-Circuit Model for Horizontal and Vertical HALL Devices</title><title>2007 IEEE Sensors</title><addtitle>ICSENS</addtitle><description>A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results.</description><subject>Computational modeling</subject><subject>Conductivity</subject><subject>Electronic design automation and methodology</subject><subject>Integral equations</subject><subject>Magnetic sensors</subject><subject>Magnetoresistance</subject><subject>Semiconductor device modeling</subject><subject>Sensor phenomena and characterization</subject><subject>Solid modeling</subject><subject>Temperature sensors</subject><issn>1930-0395</issn><issn>2168-9229</issn><isbn>1424412617</isbn><isbn>9781424412617</isbn><isbn>9781424412624</isbn><isbn>1424412625</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo1kMtuwjAURN2XVKB8ARv_QFLb147tJUqhIKXtIqhb5Dg3kiuHoCRUol9fpNLVLEZndDSELDhLOWf2eZuXq_cyFYzpVIIxkskbMrfacCmk5CIT8pZMBM9MYoWwd2T6X3B9TybcAksYWPVIpsPwxZhgSpgJKZc079pjxBHjmZbeRVdFpMWpPWKd5KH3pzDSt67GSJuup5uuDz_dYXSRukNNP7EfwwWim2VR0Bf8Dh6HJ_LQuDjg_JozsluvdvkmKT5et_mySALXakyAY-YbDQ6M9F5ykD7jVd1YrRCgElVzUffgpdIgK2cBlFeN8tJqBGZgRhZ_swER98c-tK4_76_fwC_bB1NE</recordid><startdate>200710</startdate><enddate>200710</enddate><creator>Dimitropoulos, P.D.</creator><creator>Reymond, S.</creator><creator>Drljaca, P.M.</creator><creator>Popovic, R.S.</creator><creator>Nastos, N.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200710</creationdate><title>A Completely Scalable Lumped-Circuit Model for Horizontal and Vertical HALL Devices</title><author>Dimitropoulos, P.D. ; Reymond, S. ; Drljaca, P.M. ; Popovic, R.S. ; Nastos, N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-31e6cf73a384cc4134c61bdf975e33b2bf617c3c45734ba9335c5f5c497e3083</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Computational modeling</topic><topic>Conductivity</topic><topic>Electronic design automation and methodology</topic><topic>Integral equations</topic><topic>Magnetic sensors</topic><topic>Magnetoresistance</topic><topic>Semiconductor device modeling</topic><topic>Sensor phenomena and characterization</topic><topic>Solid modeling</topic><topic>Temperature sensors</topic><toplevel>online_resources</toplevel><creatorcontrib>Dimitropoulos, P.D.</creatorcontrib><creatorcontrib>Reymond, S.</creatorcontrib><creatorcontrib>Drljaca, P.M.</creatorcontrib><creatorcontrib>Popovic, R.S.</creatorcontrib><creatorcontrib>Nastos, N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dimitropoulos, P.D.</au><au>Reymond, S.</au><au>Drljaca, P.M.</au><au>Popovic, R.S.</au><au>Nastos, N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A Completely Scalable Lumped-Circuit Model for Horizontal and Vertical HALL Devices</atitle><btitle>2007 IEEE Sensors</btitle><stitle>ICSENS</stitle><date>2007-10</date><risdate>2007</risdate><spage>337</spage><epage>340</epage><pages>337-340</pages><issn>1930-0395</issn><eissn>2168-9229</eissn><isbn>1424412617</isbn><isbn>9781424412617</isbn><eisbn>9781424412624</eisbn><eisbn>1424412625</eisbn><abstract>A completely scalable lumped-circuit model for horizontal and vertical HALL devices is presented therein that can be efficiently implemented in SPICE-like EDA simulators. The model has been employed for the quantitative analysis of: a) geometrical, b) temperature, and c) field-dependent mobility effects, as well as for d) the dynamic response and e) the noise behavior of several HALL sensors. A series of experimental data is presented along with simulation results.</abstract><pub>IEEE</pub><doi>10.1109/ICSENS.2007.4388404</doi><tpages>4</tpages></addata></record>
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Computational modeling
Conductivity
Electronic design automation and methodology
Integral equations
Magnetic sensors
Magnetoresistance
Semiconductor device modeling
Sensor phenomena and characterization
Solid modeling
Temperature sensors
title A Completely Scalable Lumped-Circuit Model for Horizontal and Vertical HALL Devices
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T09%3A16%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20Completely%20Scalable%20Lumped-Circuit%20Model%20for%20Horizontal%20and%20Vertical%20HALL%20Devices&rft.btitle=2007%20IEEE%20Sensors&rft.au=Dimitropoulos,%20P.D.&rft.date=2007-10&rft.spage=337&rft.epage=340&rft.pages=337-340&rft.issn=1930-0395&rft.eissn=2168-9229&rft.isbn=1424412617&rft.isbn_list=9781424412617&rft_id=info:doi/10.1109/ICSENS.2007.4388404&rft.eisbn=9781424412624&rft.eisbn_list=1424412625&rft_dat=%3Cieee_6IE%3E4388404%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-31e6cf73a384cc4134c61bdf975e33b2bf617c3c45734ba9335c5f5c497e3083%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4388404&rfr_iscdi=true