Sequential Variations of Fraunhofer Diffraction Pattern by Optical 4f Imaging System in As2S3 Thin Film

We observed sequential changes of Fraunhofer diffraction pattern due to photoinduced nonlinear refractive index changes in chalcogenide amorphous AS 2 S 3 thin film by utilizing the optical 4f imaging system and also measured the power distribution of the temporal observed patterns.

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Bibliographic Details
Main Authors: Yang, H.R., Kim, E.J., Kim, G.Y., Park, S.Y., Kwak, C.H.
Format: Conference Proceeding
Language:English
Subjects:
Amorphous materials
Nonlinear optics
Optical diffraction
Optical films
Optical imaging
Optical refraction
Optical variables control
Power distribution
Power measurement
Refractive index
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Description
Summary:We observed sequential changes of Fraunhofer diffraction pattern due to photoinduced nonlinear refractive index changes in chalcogenide amorphous AS 2 S 3 thin film by utilizing the optical 4f imaging system and also measured the power distribution of the temporal observed patterns.
DOI:10.1109/CLEOPR.2007.4391332