Loading…
A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement
As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional determin...
Saved in:
Main Authors: | , , , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 319 |
container_issue | |
container_start_page | 316 |
container_title | |
container_volume | |
creator | I-Chyn Wey You-Gang Chen Changhong Yu Jie Chen An-Yeu Wu |
description | As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. However, probabilistic-based designs cost larger hardware area. In this paper, we design and implement a hardware-efficient probabilistic-based noise-tolerant circuit, an 8-bit Markov random field carry lookahead adder (MRF_CLA), in 0.13 mum CMOS process technology. The measurement results show that the proposed MRF_CLA can provide 24.5 dB of noise-immunity enhancement as compared with its conventional CMOS design. Moreover, the transistor count can be saved 42% as compared to the state-of-art MRF design [1]. |
doi_str_mv | 10.1109/ASSCC.2007.4425694 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4425694</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4425694</ieee_id><sourcerecordid>4425694</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-8e2dac135ec7d344e21d349600163f5b78e552f07efa969088b5a7ce492222683</originalsourceid><addsrcrecordid>eNo9kE1OwzAQhY0QElB6Adj4Agm2Y8fxskT8SZVYFNaV40zooPzJcal6Aw7FGTgTBipm8zSj7z3pDSGXnKWcM3O9WK3KMhWM6VRKoXIjj8g5l0JKnuVMHf8vyvBTMp-mN8YY13m8iDPysaAxJ_v67OjG-npnPSTQNOgQ-kBHP1S2whangC6p7AQ17QecIAlDC95GxKF3Wwy0hglfe2r7mmI3ttBFvw049HSHYUOFTFV9czBj1217DPsf0g_vv-wFOWlsO8H8oDPycnf7XD4ky6f7x3KxTJBrFZICRG1dLANO15mUIHgUk8dKedaoSheglGiYhsaa3LCiqJTVDqQRcfIim5Grv1wEgPXosbN-vz58LvsG7-VkhQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>I-Chyn Wey ; You-Gang Chen ; Changhong Yu ; Jie Chen ; An-Yeu Wu</creator><creatorcontrib>I-Chyn Wey ; You-Gang Chen ; Changhong Yu ; Jie Chen ; An-Yeu Wu</creatorcontrib><description>As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. However, probabilistic-based designs cost larger hardware area. In this paper, we design and implement a hardware-efficient probabilistic-based noise-tolerant circuit, an 8-bit Markov random field carry lookahead adder (MRF_CLA), in 0.13 mum CMOS process technology. The measurement results show that the proposed MRF_CLA can provide 24.5 dB of noise-immunity enhancement as compared with its conventional CMOS design. Moreover, the transistor count can be saved 42% as compared to the state-of-art MRF design [1].</description><identifier>ISBN: 1424413591</identifier><identifier>ISBN: 9781424413591</identifier><identifier>EISBN: 1424413605</identifier><identifier>EISBN: 9781424413607</identifier><identifier>DOI: 10.1109/ASSCC.2007.4425694</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit noise ; Circuit optimization ; Circuit synthesis ; Costs ; Hardware ; Interference ; Markov random fields ; Nanoscale devices ; Noise level ; Very large scale integration</subject><ispartof>2007 IEEE Asian Solid-State Circuits Conference, 2007, p.316-319</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4425694$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,2052,27906,54901</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4425694$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>I-Chyn Wey</creatorcontrib><creatorcontrib>You-Gang Chen</creatorcontrib><creatorcontrib>Changhong Yu</creatorcontrib><creatorcontrib>Jie Chen</creatorcontrib><creatorcontrib>An-Yeu Wu</creatorcontrib><title>A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement</title><title>2007 IEEE Asian Solid-State Circuits Conference</title><addtitle>ASSCC</addtitle><description>As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. However, probabilistic-based designs cost larger hardware area. In this paper, we design and implement a hardware-efficient probabilistic-based noise-tolerant circuit, an 8-bit Markov random field carry lookahead adder (MRF_CLA), in 0.13 mum CMOS process technology. The measurement results show that the proposed MRF_CLA can provide 24.5 dB of noise-immunity enhancement as compared with its conventional CMOS design. Moreover, the transistor count can be saved 42% as compared to the state-of-art MRF design [1].</description><subject>Circuit noise</subject><subject>Circuit optimization</subject><subject>Circuit synthesis</subject><subject>Costs</subject><subject>Hardware</subject><subject>Interference</subject><subject>Markov random fields</subject><subject>Nanoscale devices</subject><subject>Noise level</subject><subject>Very large scale integration</subject><isbn>1424413591</isbn><isbn>9781424413591</isbn><isbn>1424413605</isbn><isbn>9781424413607</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo9kE1OwzAQhY0QElB6Adj4Agm2Y8fxskT8SZVYFNaV40zooPzJcal6Aw7FGTgTBipm8zSj7z3pDSGXnKWcM3O9WK3KMhWM6VRKoXIjj8g5l0JKnuVMHf8vyvBTMp-mN8YY13m8iDPysaAxJ_v67OjG-npnPSTQNOgQ-kBHP1S2whangC6p7AQ17QecIAlDC95GxKF3Wwy0hglfe2r7mmI3ttBFvw049HSHYUOFTFV9czBj1217DPsf0g_vv-wFOWlsO8H8oDPycnf7XD4ky6f7x3KxTJBrFZICRG1dLANO15mUIHgUk8dKedaoSheglGiYhsaa3LCiqJTVDqQRcfIim5Grv1wEgPXosbN-vz58LvsG7-VkhQ</recordid><startdate>200711</startdate><enddate>200711</enddate><creator>I-Chyn Wey</creator><creator>You-Gang Chen</creator><creator>Changhong Yu</creator><creator>Jie Chen</creator><creator>An-Yeu Wu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200711</creationdate><title>A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement</title><author>I-Chyn Wey ; You-Gang Chen ; Changhong Yu ; Jie Chen ; An-Yeu Wu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-8e2dac135ec7d344e21d349600163f5b78e552f07efa969088b5a7ce492222683</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Circuit noise</topic><topic>Circuit optimization</topic><topic>Circuit synthesis</topic><topic>Costs</topic><topic>Hardware</topic><topic>Interference</topic><topic>Markov random fields</topic><topic>Nanoscale devices</topic><topic>Noise level</topic><topic>Very large scale integration</topic><toplevel>online_resources</toplevel><creatorcontrib>I-Chyn Wey</creatorcontrib><creatorcontrib>You-Gang Chen</creatorcontrib><creatorcontrib>Changhong Yu</creatorcontrib><creatorcontrib>Jie Chen</creatorcontrib><creatorcontrib>An-Yeu Wu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>I-Chyn Wey</au><au>You-Gang Chen</au><au>Changhong Yu</au><au>Jie Chen</au><au>An-Yeu Wu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement</atitle><btitle>2007 IEEE Asian Solid-State Circuits Conference</btitle><stitle>ASSCC</stitle><date>2007-11</date><risdate>2007</risdate><spage>316</spage><epage>319</epage><pages>316-319</pages><isbn>1424413591</isbn><isbn>9781424413591</isbn><eisbn>1424413605</eisbn><eisbn>9781424413607</eisbn><abstract>As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. However, probabilistic-based designs cost larger hardware area. In this paper, we design and implement a hardware-efficient probabilistic-based noise-tolerant circuit, an 8-bit Markov random field carry lookahead adder (MRF_CLA), in 0.13 mum CMOS process technology. The measurement results show that the proposed MRF_CLA can provide 24.5 dB of noise-immunity enhancement as compared with its conventional CMOS design. Moreover, the transistor count can be saved 42% as compared to the state-of-art MRF design [1].</abstract><pub>IEEE</pub><doi>10.1109/ASSCC.2007.4425694</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISBN: 1424413591 |
ispartof | 2007 IEEE Asian Solid-State Circuits Conference, 2007, p.316-319 |
issn | |
language | eng |
recordid | cdi_ieee_primary_4425694 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuit noise Circuit optimization Circuit synthesis Costs Hardware Interference Markov random fields Nanoscale devices Noise level Very large scale integration |
title | A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T08%3A09%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%200.13%CE%BCm%20hardware-efficient%20probabilistic-based%20noise-tolerant%20circuit%20design%20and%20implementation%20with%2024.5dB%20noise-immunity%20improvement&rft.btitle=2007%20IEEE%20Asian%20Solid-State%20Circuits%20Conference&rft.au=I-Chyn%20Wey&rft.date=2007-11&rft.spage=316&rft.epage=319&rft.pages=316-319&rft.isbn=1424413591&rft.isbn_list=9781424413591&rft_id=info:doi/10.1109/ASSCC.2007.4425694&rft.eisbn=1424413605&rft.eisbn_list=9781424413607&rft_dat=%3Cieee_6IE%3E4425694%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-8e2dac135ec7d344e21d349600163f5b78e552f07efa969088b5a7ce492222683%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4425694&rfr_iscdi=true |