Loading…
Measurement accuracy of a TM0m0 mode cavity method to measure complex permittivity of rod samples
A measurement method using the TM 0m0 mode cylindrical cavity with a dielectric rod sample inserted on the center axis is proposed to measure the accurate complex permittivity (relative permittivity epsiv r and loss tangent tandelta), which can be obtained by the rigorous electromagnetic field analy...
Saved in:
Main Authors: | , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 1470 |
container_issue | |
container_start_page | 1465 |
container_title | |
container_volume | |
creator | Kawabata, H. Kobayashi, T. |
description | A measurement method using the TM 0m0 mode cylindrical cavity with a dielectric rod sample inserted on the center axis is proposed to measure the accurate complex permittivity (relative permittivity epsiv r and loss tangent tandelta), which can be obtained by the rigorous electromagnetic field analysis on the basis of the Ritz-Galerkin method. The complex permittivity of a polyethylene rod sample is measured using three cavities with different dimensions resonating in the TM 010 and TM 020 modes. Measured results were compared with ones for the conventional perturbation method and the accuracy is discussed. As a result, the measurement accuracy of epsiv r and tandelta was improved within 2 and 5 percents by the present method, respectively. |
doi_str_mv | 10.1109/APMC.2006.4429683 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4429683</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4429683</ieee_id><sourcerecordid>4429683</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-e15191fa9475f3485b01a5251c372b0eab5f3ec9f40dd9e90e8945a9925441043</originalsourceid><addsrcrecordid>eNpNkMlOw0AQRIdNAoV8AOIyP-DQPYvtPkYRm5QIDrlHnXFbGGVwZE8Q-XtMiBCnatWrqkMrdYMwQQS6m74uZhMDkE-cM5SX9kSNqSgdgbGWEPNTdWUw95krnD37z6DMz_-YKS7VuO_fAWAYQ3T2SvFCuN91EuUjaQ5h13HY67bWrJcLiKBjW4kO_NmkvY6S3tpKp3a4Di0d2rjdyJfeSheblJpDbGh3Q6znH9Zfq4uaN72MjzpSy4f75ewpm788Ps-m86whSJmgR8KayRW-tq70a0D2xmOwhVmD8HqwJVDtoKpICKQk55nIeOcQnB2p29_ZRkRW266J3O1Xx3_Zb6kCWc4</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Measurement accuracy of a TM0m0 mode cavity method to measure complex permittivity of rod samples</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kawabata, H. ; Kobayashi, T.</creator><creatorcontrib>Kawabata, H. ; Kobayashi, T.</creatorcontrib><description>A measurement method using the TM 0m0 mode cylindrical cavity with a dielectric rod sample inserted on the center axis is proposed to measure the accurate complex permittivity (relative permittivity epsiv r and loss tangent tandelta), which can be obtained by the rigorous electromagnetic field analysis on the basis of the Ritz-Galerkin method. The complex permittivity of a polyethylene rod sample is measured using three cavities with different dimensions resonating in the TM 010 and TM 020 modes. Measured results were compared with ones for the conventional perturbation method and the accuracy is discussed. As a result, the measurement accuracy of epsiv r and tandelta was improved within 2 and 5 percents by the present method, respectively.</description><identifier>ISSN: 2165-4727</identifier><identifier>ISBN: 9784902339086</identifier><identifier>ISBN: 4902339080</identifier><identifier>EISSN: 2165-4743</identifier><identifier>EISBN: 9784902339116</identifier><identifier>EISBN: 4902339110</identifier><identifier>DOI: 10.1109/APMC.2006.4429683</identifier><language>eng</language><publisher>IEEE</publisher><subject>Complex permittivity ; cylindrical cavity ; Dielectric loss measurement ; Dielectric losses ; dielectric material ; Dielectric measurements ; Electromagnetic analysis ; Electromagnetic fields ; Electromagnetic measurements ; Loss measurement ; Permittivity measurement ; perturbation method ; Perturbation methods ; Polyethylene</subject><ispartof>2006 Asia-Pacific Microwave Conference, 2006, p.1465-1470</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4429683$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4429683$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kawabata, H.</creatorcontrib><creatorcontrib>Kobayashi, T.</creatorcontrib><title>Measurement accuracy of a TM0m0 mode cavity method to measure complex permittivity of rod samples</title><title>2006 Asia-Pacific Microwave Conference</title><addtitle>APMC</addtitle><description>A measurement method using the TM 0m0 mode cylindrical cavity with a dielectric rod sample inserted on the center axis is proposed to measure the accurate complex permittivity (relative permittivity epsiv r and loss tangent tandelta), which can be obtained by the rigorous electromagnetic field analysis on the basis of the Ritz-Galerkin method. The complex permittivity of a polyethylene rod sample is measured using three cavities with different dimensions resonating in the TM 010 and TM 020 modes. Measured results were compared with ones for the conventional perturbation method and the accuracy is discussed. As a result, the measurement accuracy of epsiv r and tandelta was improved within 2 and 5 percents by the present method, respectively.</description><subject>Complex permittivity</subject><subject>cylindrical cavity</subject><subject>Dielectric loss measurement</subject><subject>Dielectric losses</subject><subject>dielectric material</subject><subject>Dielectric measurements</subject><subject>Electromagnetic analysis</subject><subject>Electromagnetic fields</subject><subject>Electromagnetic measurements</subject><subject>Loss measurement</subject><subject>Permittivity measurement</subject><subject>perturbation method</subject><subject>Perturbation methods</subject><subject>Polyethylene</subject><issn>2165-4727</issn><issn>2165-4743</issn><isbn>9784902339086</isbn><isbn>4902339080</isbn><isbn>9784902339116</isbn><isbn>4902339110</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpNkMlOw0AQRIdNAoV8AOIyP-DQPYvtPkYRm5QIDrlHnXFbGGVwZE8Q-XtMiBCnatWrqkMrdYMwQQS6m74uZhMDkE-cM5SX9kSNqSgdgbGWEPNTdWUw95krnD37z6DMz_-YKS7VuO_fAWAYQ3T2SvFCuN91EuUjaQ5h13HY67bWrJcLiKBjW4kO_NmkvY6S3tpKp3a4Di0d2rjdyJfeSheblJpDbGh3Q6znH9Zfq4uaN72MjzpSy4f75ewpm788Ps-m86whSJmgR8KayRW-tq70a0D2xmOwhVmD8HqwJVDtoKpICKQk55nIeOcQnB2p29_ZRkRW266J3O1Xx3_Zb6kCWc4</recordid><startdate>200612</startdate><enddate>200612</enddate><creator>Kawabata, H.</creator><creator>Kobayashi, T.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200612</creationdate><title>Measurement accuracy of a TM0m0 mode cavity method to measure complex permittivity of rod samples</title><author>Kawabata, H. ; Kobayashi, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-e15191fa9475f3485b01a5251c372b0eab5f3ec9f40dd9e90e8945a9925441043</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Complex permittivity</topic><topic>cylindrical cavity</topic><topic>Dielectric loss measurement</topic><topic>Dielectric losses</topic><topic>dielectric material</topic><topic>Dielectric measurements</topic><topic>Electromagnetic analysis</topic><topic>Electromagnetic fields</topic><topic>Electromagnetic measurements</topic><topic>Loss measurement</topic><topic>Permittivity measurement</topic><topic>perturbation method</topic><topic>Perturbation methods</topic><topic>Polyethylene</topic><toplevel>online_resources</toplevel><creatorcontrib>Kawabata, H.</creatorcontrib><creatorcontrib>Kobayashi, T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEL</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kawabata, H.</au><au>Kobayashi, T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Measurement accuracy of a TM0m0 mode cavity method to measure complex permittivity of rod samples</atitle><btitle>2006 Asia-Pacific Microwave Conference</btitle><stitle>APMC</stitle><date>2006-12</date><risdate>2006</risdate><spage>1465</spage><epage>1470</epage><pages>1465-1470</pages><issn>2165-4727</issn><eissn>2165-4743</eissn><isbn>9784902339086</isbn><isbn>4902339080</isbn><eisbn>9784902339116</eisbn><eisbn>4902339110</eisbn><abstract>A measurement method using the TM 0m0 mode cylindrical cavity with a dielectric rod sample inserted on the center axis is proposed to measure the accurate complex permittivity (relative permittivity epsiv r and loss tangent tandelta), which can be obtained by the rigorous electromagnetic field analysis on the basis of the Ritz-Galerkin method. The complex permittivity of a polyethylene rod sample is measured using three cavities with different dimensions resonating in the TM 010 and TM 020 modes. Measured results were compared with ones for the conventional perturbation method and the accuracy is discussed. As a result, the measurement accuracy of epsiv r and tandelta was improved within 2 and 5 percents by the present method, respectively.</abstract><pub>IEEE</pub><doi>10.1109/APMC.2006.4429683</doi><tpages>6</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 2165-4727 |
ispartof | 2006 Asia-Pacific Microwave Conference, 2006, p.1465-1470 |
issn | 2165-4727 2165-4743 |
language | eng |
recordid | cdi_ieee_primary_4429683 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Complex permittivity cylindrical cavity Dielectric loss measurement Dielectric losses dielectric material Dielectric measurements Electromagnetic analysis Electromagnetic fields Electromagnetic measurements Loss measurement Permittivity measurement perturbation method Perturbation methods Polyethylene |
title | Measurement accuracy of a TM0m0 mode cavity method to measure complex permittivity of rod samples |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T08%3A02%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Measurement%20accuracy%20of%20a%20TM0m0%20mode%20cavity%20method%20to%20measure%20complex%20permittivity%20of%20rod%20samples&rft.btitle=2006%20Asia-Pacific%20Microwave%20Conference&rft.au=Kawabata,%20H.&rft.date=2006-12&rft.spage=1465&rft.epage=1470&rft.pages=1465-1470&rft.issn=2165-4727&rft.eissn=2165-4743&rft.isbn=9784902339086&rft.isbn_list=4902339080&rft_id=info:doi/10.1109/APMC.2006.4429683&rft.eisbn=9784902339116&rft.eisbn_list=4902339110&rft_dat=%3Cieee_6IE%3E4429683%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-e15191fa9475f3485b01a5251c372b0eab5f3ec9f40dd9e90e8945a9925441043%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4429683&rfr_iscdi=true |