Practical Usage of Design of Experiments in SMT-Production Processes

The design of experiments (DoE) is one method, to optimize processes and to get more information from "inside " of the processes. The paper demonstrates with two typical examples the practical usage of this mathematical method in the production of SMT-boards. Quality parameters are here th...

Full description

Saved in:
Bibliographic Details
Main Authors: Wohlrabe, H., Wolter, K.-J.
Format: Conference Proceeding
Language:English
Subjects:
Area measurement
Assembly
Atmosphere
Noise figure
Production
Robust stability
Soldering
Temperature
Testing
Tin
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 419
container_issue
container_start_page 414
container_title
container_volume
creator Wohlrabe, H.
Wolter, K.-J.
description The design of experiments (DoE) is one method, to optimize processes and to get more information from "inside " of the processes. The paper demonstrates with two typical examples the practical usage of this mathematical method in the production of SMT-boards. Quality parameters are here the main target of such an optimization. The identification of critical parameters and their optimized setup is also an important task for the DoE. Robustness and a high stability are also possible responses for such an analysis.
doi_str_mv 10.1109/ISSE.2007.4432891
format conference_proceeding
fullrecord <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_4432891</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4432891</ieee_id><sourcerecordid>4432891</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-f4da2afffeb1c0c145fb53c4047811cc10647ee61d1cb48b45e2bb2ee2ff5b5e3</originalsourceid><addsrcrecordid>eNotj1FLwzAUhQM6cMz-APElf6A1N71p2kfZqg4mG3R7Hkl6MyKzHU0F_fdW3NP5Xs7hO4w9gMgARPW0bpo6k0LoDDGXZQU3LKl0CSgRQYLGWzaXUEAqlSzvWBLjhxACdIEg8jlb7QbjxuDMmR-iORHvPV9RDKfuj-rvCw3hk7ox8tDx5n2f7oa-_ZoafccndBQjxXs28-YcKbnmgh1e6v3yLd1sX9fL500aQKsx9dgaabz3ZMEJB6i8VblDgZMvOAeiQE1UQAvOYmlRkbRWEknvlVWUL9jj_24gouNlMjPDz_H6O_8FyLRMNw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Practical Usage of Design of Experiments in SMT-Production Processes</title><source>IEEE Xplore All Conference Series</source><creator>Wohlrabe, H. ; Wolter, K.-J.</creator><creatorcontrib>Wohlrabe, H. ; Wolter, K.-J.</creatorcontrib><description>The design of experiments (DoE) is one method, to optimize processes and to get more information from "inside " of the processes. The paper demonstrates with two typical examples the practical usage of this mathematical method in the production of SMT-boards. Quality parameters are here the main target of such an optimization. The identification of critical parameters and their optimized setup is also an important task for the DoE. Robustness and a high stability are also possible responses for such an analysis.</description><identifier>ISSN: 2161-2528</identifier><identifier>ISBN: 9781424412174</identifier><identifier>ISBN: 142441217X</identifier><identifier>DOI: 10.1109/ISSE.2007.4432891</identifier><language>eng</language><publisher>IEEE</publisher><subject>Area measurement ; Assembly ; Atmosphere ; Noise figure ; Production ; Robust stability ; Soldering ; Temperature ; Testing ; Tin</subject><ispartof>2007 30th International Spring Seminar on Electronics Technology (ISSE), 2007, p.414-419</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4432891$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4432891$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Wohlrabe, H.</creatorcontrib><creatorcontrib>Wolter, K.-J.</creatorcontrib><title>Practical Usage of Design of Experiments in SMT-Production Processes</title><title>2007 30th International Spring Seminar on Electronics Technology (ISSE)</title><addtitle>ISSE</addtitle><description>The design of experiments (DoE) is one method, to optimize processes and to get more information from "inside " of the processes. The paper demonstrates with two typical examples the practical usage of this mathematical method in the production of SMT-boards. Quality parameters are here the main target of such an optimization. The identification of critical parameters and their optimized setup is also an important task for the DoE. Robustness and a high stability are also possible responses for such an analysis.</description><subject>Area measurement</subject><subject>Assembly</subject><subject>Atmosphere</subject><subject>Noise figure</subject><subject>Production</subject><subject>Robust stability</subject><subject>Soldering</subject><subject>Temperature</subject><subject>Testing</subject><subject>Tin</subject><issn>2161-2528</issn><isbn>9781424412174</isbn><isbn>142441217X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj1FLwzAUhQM6cMz-APElf6A1N71p2kfZqg4mG3R7Hkl6MyKzHU0F_fdW3NP5Xs7hO4w9gMgARPW0bpo6k0LoDDGXZQU3LKl0CSgRQYLGWzaXUEAqlSzvWBLjhxACdIEg8jlb7QbjxuDMmR-iORHvPV9RDKfuj-rvCw3hk7ox8tDx5n2f7oa-_ZoafccndBQjxXs28-YcKbnmgh1e6v3yLd1sX9fL500aQKsx9dgaabz3ZMEJB6i8VblDgZMvOAeiQE1UQAvOYmlRkbRWEknvlVWUL9jj_24gouNlMjPDz_H6O_8FyLRMNw</recordid><startdate>200705</startdate><enddate>200705</enddate><creator>Wohlrabe, H.</creator><creator>Wolter, K.-J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200705</creationdate><title>Practical Usage of Design of Experiments in SMT-Production Processes</title><author>Wohlrabe, H. ; Wolter, K.-J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-f4da2afffeb1c0c145fb53c4047811cc10647ee61d1cb48b45e2bb2ee2ff5b5e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Area measurement</topic><topic>Assembly</topic><topic>Atmosphere</topic><topic>Noise figure</topic><topic>Production</topic><topic>Robust stability</topic><topic>Soldering</topic><topic>Temperature</topic><topic>Testing</topic><topic>Tin</topic><toplevel>online_resources</toplevel><creatorcontrib>Wohlrabe, H.</creatorcontrib><creatorcontrib>Wolter, K.-J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wohlrabe, H.</au><au>Wolter, K.-J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Practical Usage of Design of Experiments in SMT-Production Processes</atitle><btitle>2007 30th International Spring Seminar on Electronics Technology (ISSE)</btitle><stitle>ISSE</stitle><date>2007-05</date><risdate>2007</risdate><spage>414</spage><epage>419</epage><pages>414-419</pages><issn>2161-2528</issn><isbn>9781424412174</isbn><isbn>142441217X</isbn><abstract>The design of experiments (DoE) is one method, to optimize processes and to get more information from "inside " of the processes. The paper demonstrates with two typical examples the practical usage of this mathematical method in the production of SMT-boards. Quality parameters are here the main target of such an optimization. The identification of critical parameters and their optimized setup is also an important task for the DoE. Robustness and a high stability are also possible responses for such an analysis.</abstract><pub>IEEE</pub><doi>10.1109/ISSE.2007.4432891</doi><tpages>6</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 2161-2528
ispartof 2007 30th International Spring Seminar on Electronics Technology (ISSE), 2007, p.414-419
issn 2161-2528
language eng
recordid cdi_ieee_primary_4432891
source IEEE Xplore All Conference Series
subjects Area measurement
Assembly
Atmosphere
Noise figure
Production
Robust stability
Soldering
Temperature
Testing
Tin
title Practical Usage of Design of Experiments in SMT-Production Processes
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-30T22%3A36%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Practical%20Usage%20of%20Design%20of%20Experiments%20in%20SMT-Production%20Processes&rft.btitle=2007%2030th%20International%20Spring%20Seminar%20on%20Electronics%20Technology%20(ISSE)&rft.au=Wohlrabe,%20H.&rft.date=2007-05&rft.spage=414&rft.epage=419&rft.pages=414-419&rft.issn=2161-2528&rft.isbn=9781424412174&rft.isbn_list=142441217X&rft_id=info:doi/10.1109/ISSE.2007.4432891&rft_dat=%3Cieee_CHZPO%3E4432891%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-f4da2afffeb1c0c145fb53c4047811cc10647ee61d1cb48b45e2bb2ee2ff5b5e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4432891&rfr_iscdi=true