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A study of GEM foils produced at Tech-Etch

Tech-Etch is a manufacturing company that produces numerous types of flexible circuits and precision photo- etched parts for industrial use. They have developed the capability for producing GEM foils which can be used in a variety of research or commercial applications. We have studied a number of G...

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Main Authors: Azmoun, B., Caccavano, A., Crary, D., Herstoff, J., Kearney, K., Keeler, G., Majka, R., Saini, G., Sinsheimer, J., Simon, F., Smirnov, N., Surrow, B., Woody, C.
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creator Azmoun, B.
Caccavano, A.
Crary, D.
Herstoff, J.
Kearney, K.
Keeler, G.
Majka, R.
Saini, G.
Sinsheimer, J.
Simon, F.
Smirnov, N.
Surrow, B.
Woody, C.
description Tech-Etch is a manufacturing company that produces numerous types of flexible circuits and precision photo- etched parts for industrial use. They have developed the capability for producing GEM foils which can be used in a variety of research or commercial applications. We have studied a number of GEM foils produced at Tech-Etch and compared their properties and performance to GEM foils produced at CERN and by other manufacturers. Results will be reported on their gain characteristics, gain stability and uniformity, and rate dependence compared to other foils, and on their performance as actual tracking detectors in a test beam environment.
doi_str_mv 10.1109/NSSMIC.2007.4437142
format conference_proceeding
fullrecord <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_4437142</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4437142</ieee_id><sourcerecordid>4437142</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-84a8f3787d5a60de291682f50b6633e9222664e237529b6c70a7dc116d9d642e3</originalsourceid><addsrcrecordid>eNpFj81qwzAQhNU_qJP2CXLRuSB3tVpJ1jEYNw0k7SHpOSiWTFxSHCznkLevoYFeZmA-GGYYm0nIpQT3-rHZrJdljgA2J1JWEt6wyahE4FCpW5ahtlZAge7uH6C-Z5kcQ6GMpkc2SekbAEERZexlztNwDhfeNXxRrXnTtcfET30XznUM3A98G-uDqIb68MQeGn9M8fnqU_b1Vm3Ld7H6XCzL-Uq00upBFOSLRtnCBu0NhIhOmgIbDXtjlIrjHjSGIiqr0e1NbcHbUEtpgguGMKopm_31tjHG3alvf3x_2V0Pq1-cPkKk</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A study of GEM foils produced at Tech-Etch</title><source>IEEE Xplore All Conference Series</source><creator>Azmoun, B. ; Caccavano, A. ; Crary, D. ; Herstoff, J. ; Kearney, K. ; Keeler, G. ; Majka, R. ; Saini, G. ; Sinsheimer, J. ; Simon, F. ; Smirnov, N. ; Surrow, B. ; Woody, C.</creator><creatorcontrib>Azmoun, B. ; Caccavano, A. ; Crary, D. ; Herstoff, J. ; Kearney, K. ; Keeler, G. ; Majka, R. ; Saini, G. ; Sinsheimer, J. ; Simon, F. ; Smirnov, N. ; Surrow, B. ; Woody, C.</creatorcontrib><description>Tech-Etch is a manufacturing company that produces numerous types of flexible circuits and precision photo- etched parts for industrial use. They have developed the capability for producing GEM foils which can be used in a variety of research or commercial applications. We have studied a number of GEM foils produced at Tech-Etch and compared their properties and performance to GEM foils produced at CERN and by other manufacturers. Results will be reported on their gain characteristics, gain stability and uniformity, and rate dependence compared to other foils, and on their performance as actual tracking detectors in a test beam environment.</description><identifier>ISSN: 1082-3654</identifier><identifier>ISBN: 1424409225</identifier><identifier>ISBN: 9781424409228</identifier><identifier>EISSN: 2577-0829</identifier><identifier>EISBN: 1424409233</identifier><identifier>EISBN: 9781424409235</identifier><identifier>DOI: 10.1109/NSSMIC.2007.4437142</identifier><language>eng</language><publisher>IEEE</publisher><subject>Detectors ; Etching ; Flexible manufacturing systems ; Flexible printed circuits ; Geometry ; Manufacturing industries ; Nuclear physics ; Performance gain ; Production ; Testing</subject><ispartof>2007 IEEE Nuclear Science Symposium Conference Record, 2007, Vol.6, p.4634-4639</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4437142$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4437142$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Azmoun, B.</creatorcontrib><creatorcontrib>Caccavano, A.</creatorcontrib><creatorcontrib>Crary, D.</creatorcontrib><creatorcontrib>Herstoff, J.</creatorcontrib><creatorcontrib>Kearney, K.</creatorcontrib><creatorcontrib>Keeler, G.</creatorcontrib><creatorcontrib>Majka, R.</creatorcontrib><creatorcontrib>Saini, G.</creatorcontrib><creatorcontrib>Sinsheimer, J.</creatorcontrib><creatorcontrib>Simon, F.</creatorcontrib><creatorcontrib>Smirnov, N.</creatorcontrib><creatorcontrib>Surrow, B.</creatorcontrib><creatorcontrib>Woody, C.</creatorcontrib><title>A study of GEM foils produced at Tech-Etch</title><title>2007 IEEE Nuclear Science Symposium Conference Record</title><addtitle>NSSMIC</addtitle><description>Tech-Etch is a manufacturing company that produces numerous types of flexible circuits and precision photo- etched parts for industrial use. They have developed the capability for producing GEM foils which can be used in a variety of research or commercial applications. We have studied a number of GEM foils produced at Tech-Etch and compared their properties and performance to GEM foils produced at CERN and by other manufacturers. Results will be reported on their gain characteristics, gain stability and uniformity, and rate dependence compared to other foils, and on their performance as actual tracking detectors in a test beam environment.</description><subject>Detectors</subject><subject>Etching</subject><subject>Flexible manufacturing systems</subject><subject>Flexible printed circuits</subject><subject>Geometry</subject><subject>Manufacturing industries</subject><subject>Nuclear physics</subject><subject>Performance gain</subject><subject>Production</subject><subject>Testing</subject><issn>1082-3654</issn><issn>2577-0829</issn><isbn>1424409225</isbn><isbn>9781424409228</isbn><isbn>1424409233</isbn><isbn>9781424409235</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFj81qwzAQhNU_qJP2CXLRuSB3tVpJ1jEYNw0k7SHpOSiWTFxSHCznkLevoYFeZmA-GGYYm0nIpQT3-rHZrJdljgA2J1JWEt6wyahE4FCpW5ahtlZAge7uH6C-Z5kcQ6GMpkc2SekbAEERZexlztNwDhfeNXxRrXnTtcfET30XznUM3A98G-uDqIb68MQeGn9M8fnqU_b1Vm3Ld7H6XCzL-Uq00upBFOSLRtnCBu0NhIhOmgIbDXtjlIrjHjSGIiqr0e1NbcHbUEtpgguGMKopm_31tjHG3alvf3x_2V0Pq1-cPkKk</recordid><startdate>200710</startdate><enddate>200710</enddate><creator>Azmoun, B.</creator><creator>Caccavano, A.</creator><creator>Crary, D.</creator><creator>Herstoff, J.</creator><creator>Kearney, K.</creator><creator>Keeler, G.</creator><creator>Majka, R.</creator><creator>Saini, G.</creator><creator>Sinsheimer, J.</creator><creator>Simon, F.</creator><creator>Smirnov, N.</creator><creator>Surrow, B.</creator><creator>Woody, C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200710</creationdate><title>A study of GEM foils produced at Tech-Etch</title><author>Azmoun, B. ; Caccavano, A. ; Crary, D. ; Herstoff, J. ; Kearney, K. ; Keeler, G. ; Majka, R. ; Saini, G. ; Sinsheimer, J. ; Simon, F. ; Smirnov, N. ; Surrow, B. ; Woody, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-84a8f3787d5a60de291682f50b6633e9222664e237529b6c70a7dc116d9d642e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Detectors</topic><topic>Etching</topic><topic>Flexible manufacturing systems</topic><topic>Flexible printed circuits</topic><topic>Geometry</topic><topic>Manufacturing industries</topic><topic>Nuclear physics</topic><topic>Performance gain</topic><topic>Production</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Azmoun, B.</creatorcontrib><creatorcontrib>Caccavano, A.</creatorcontrib><creatorcontrib>Crary, D.</creatorcontrib><creatorcontrib>Herstoff, J.</creatorcontrib><creatorcontrib>Kearney, K.</creatorcontrib><creatorcontrib>Keeler, G.</creatorcontrib><creatorcontrib>Majka, R.</creatorcontrib><creatorcontrib>Saini, G.</creatorcontrib><creatorcontrib>Sinsheimer, J.</creatorcontrib><creatorcontrib>Simon, F.</creatorcontrib><creatorcontrib>Smirnov, N.</creatorcontrib><creatorcontrib>Surrow, B.</creatorcontrib><creatorcontrib>Woody, C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Azmoun, B.</au><au>Caccavano, A.</au><au>Crary, D.</au><au>Herstoff, J.</au><au>Kearney, K.</au><au>Keeler, G.</au><au>Majka, R.</au><au>Saini, G.</au><au>Sinsheimer, J.</au><au>Simon, F.</au><au>Smirnov, N.</au><au>Surrow, B.</au><au>Woody, C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A study of GEM foils produced at Tech-Etch</atitle><btitle>2007 IEEE Nuclear Science Symposium Conference Record</btitle><stitle>NSSMIC</stitle><date>2007-10</date><risdate>2007</risdate><volume>6</volume><spage>4634</spage><epage>4639</epage><pages>4634-4639</pages><issn>1082-3654</issn><eissn>2577-0829</eissn><isbn>1424409225</isbn><isbn>9781424409228</isbn><eisbn>1424409233</eisbn><eisbn>9781424409235</eisbn><abstract>Tech-Etch is a manufacturing company that produces numerous types of flexible circuits and precision photo- etched parts for industrial use. They have developed the capability for producing GEM foils which can be used in a variety of research or commercial applications. We have studied a number of GEM foils produced at Tech-Etch and compared their properties and performance to GEM foils produced at CERN and by other manufacturers. Results will be reported on their gain characteristics, gain stability and uniformity, and rate dependence compared to other foils, and on their performance as actual tracking detectors in a test beam environment.</abstract><pub>IEEE</pub><doi>10.1109/NSSMIC.2007.4437142</doi><tpages>6</tpages></addata></record>
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ispartof 2007 IEEE Nuclear Science Symposium Conference Record, 2007, Vol.6, p.4634-4639
issn 1082-3654
2577-0829
language eng
recordid cdi_ieee_primary_4437142
source IEEE Xplore All Conference Series
subjects Detectors
Etching
Flexible manufacturing systems
Flexible printed circuits
Geometry
Manufacturing industries
Nuclear physics
Performance gain
Production
Testing
title A study of GEM foils produced at Tech-Etch
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T20%3A04%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20study%20of%20GEM%20foils%20produced%20at%20Tech-Etch&rft.btitle=2007%20IEEE%20Nuclear%20Science%20Symposium%20Conference%20Record&rft.au=Azmoun,%20B.&rft.date=2007-10&rft.volume=6&rft.spage=4634&rft.epage=4639&rft.pages=4634-4639&rft.issn=1082-3654&rft.eissn=2577-0829&rft.isbn=1424409225&rft.isbn_list=9781424409228&rft_id=info:doi/10.1109/NSSMIC.2007.4437142&rft.eisbn=1424409233&rft.eisbn_list=9781424409235&rft_dat=%3Cieee_CHZPO%3E4437142%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-84a8f3787d5a60de291682f50b6633e9222664e237529b6c70a7dc116d9d642e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4437142&rfr_iscdi=true