Scheme for flattening of ion density distribution on a target

A scheme for flattening of the ion density distribution on a target is considered. The Xe ion beam extracted from a cyclotron has the following parameters: mass-to-charge ratio is 4.4, the kinetic energy is 4.2 MeV per nucleon, the beam current is 1 muA and the beam emittance is equal to 40 pi mm mr...

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Bibliographic Details
Main Authors: Kazarinov, N., Gulbekyan, G., Kazacha, V., Melnikov, V., Mironov, V.
Format: Conference Proceeding
Language:English
Subjects:
Cyclotrons
Gaussian distribution
Geometry
Ion beams
Kinetic energy
Lenses
Magnetostatics
Particle beams
Solid modeling
Testing
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Summary:A scheme for flattening of the ion density distribution on a target is considered. The Xe ion beam extracted from a cyclotron has the following parameters: mass-to-charge ratio is 4.4, the kinetic energy is 4.2 MeV per nucleon, the beam current is 1 muA and the beam emittance is equal to 40 pi mm mrad. The ion beam line consists of quadrupoles doublet and octupole lens. After passing through two quadrupoles the ion beam has large horizontal and small vertical dimensions. After that the octupole makes the ion beam density distribution on the target uniform withing the necessary demands. The geometry of the beam line, the quadrupole and octupole lens parameters are found during simulation. The simulated final beam density distribution on the target is also given.
ISSN:1944-4680
2152-9582
DOI:10.1109/PAC.2007.4440821