Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

This paper presents a methodology for building an integrated circuit behavioral model that enables the prediction of its electromagnetic (EM) emissions up to several gigahertz. The model, built upon S-parameter characterization and conducted emission measurements, is used to predict the EM emissions...

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Bibliographic Details
Published in:IEEE transactions on electromagnetic compatibility 2008-02, Vol.50 (1), p.22-34
Main Authors: Labussiere-Dorgan, C., Bendhia, S., Sicard, E., Junwu Tao, Quaresma, H.J., Lochot, C., Vrignon, B.
Format: Article
Language:English
Subjects:
Applied sciences
Conducted emission
Design. Technologies. Operation analysis. Testing
Electrical engineering. Electrical power engineering
Electrical machines
Electromagnetic compatibility
electromagnetic compatibility (EMC)
Electromagnetism
Electronics
Emission
Engineering Sciences
Exact sciences and technology
Information, signal and communications theory
integrated circuit (IC)
integrated circuit emission model (ICEM)
Integrated circuit modeling
Integrated circuits
Integrated circuits by function (including memories and processors)
Mathematical models
measurement standards
Methodology
microcontroller
Microcontrollers
Pins
Predictive models
radiated emission
Regulation and control
Semiconductor device measurement
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Telecommunications and information theory
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Description
Summary:This paper presents a methodology for building an integrated circuit behavioral model that enables the prediction of its electromagnetic (EM) emissions up to several gigahertz. The model, built upon S-parameter characterization and conducted emission measurements, is used to predict the EM emissions of a commercial 16-bit microcontroller. The emission measurements are performed according to several EM compatibility standards, namely, 1 Omega /150 Omega , surface scan, and transverse EM/gigahertz transverse EM (GTEM) method, and their results show an excellent fit with model predictions.
ISSN:0018-9375
1558-187X
DOI:10.1109/TEMC.2007.911918