Intensity Noise in a Wavelength-Locked Fabry-Perot Laser Diode to a Spectrum Sliced ASE

We derived analytic expression for the relative intensity noise (RIN) of a wavelength-locked Fabry-Perot laser diode (FP LD) in a single mode region. The RIN of the wavelength-locked output is a function of the photon density and the photon life time. It also depends on the wavelength detuning and t...

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Bibliographic Details
Published in:IEEE journal of quantum electronics 2008-03, Vol.44 (3), p.209-215
Main Authors: PARK, Kun-Youl, LEE, Chang-Hee
Format: Article
Language:English
Subjects:
Analytical models
Applied sciences
Bandwidth
Costs
Diode lasers
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Incoherent light injection
Lasers
Optical fiber networks
Optical telecommunications
Optics
Passive optical networks
Physics
Semiconductor device noise
Semiconductor lasers
laser diodes
spectrum sliced ASE
Spontaneous emission
Telecommunications
Telecommunications and information theory
Transfer functions
Wavelength division multiplexing
wavelength-division multiplexed passive optical network (WDM-PON)
wavelength-locked Fabry-Perot laser diode
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Summary:We derived analytic expression for the relative intensity noise (RIN) of a wavelength-locked Fabry-Perot laser diode (FP LD) in a single mode region. The RIN of the wavelength-locked output is a function of the photon density and the photon life time. It also depends on the wavelength detuning and the injected amplified spontaneous emission (ASE) power. We investigated the modulation transfer function of the wavelength-locked FP LD and its dependence on wavelength detuning. The analytic result has good agreement with the simulation result.
ISSN:0018-9197
1558-1713
DOI:10.1109/JQE.2007.911685