Analysis of the Spontaneous Emission Rate Enhancement by Surface Plasmons in a Thin Metallic Layer Embedded in Semiconductor

We study the modification of spontaneous emission rates from multi-quantum wells beneath a thin metallic layer embedded in semiconductor.

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Bibliographic Details
Main Authors: Iwase, H., Vuckovic, J.
Format: Conference Proceeding
Language:English
Subjects:
Absorption
Fabrication
Frequency estimation
Gold
Indium phosphide
Optical devices
Optical surface waves
Plasmons
Refractive index
Spontaneous emission
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Description
Summary:We study the modification of spontaneous emission rates from multi-quantum wells beneath a thin metallic layer embedded in semiconductor.
ISSN:2160-9004
DOI:10.1109/CLEO.2007.4453354