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Partially Redundant Logic Detection Using Symbolic Equivalence Checking in Reversible and Irreversible Logic Circuits
This paper investigates partially redundant logic detection and gate modification coverage in both reversible and irreversible (classical) logic circuits. Our methodology is to repeatedly compare a benchmark circuit with a modified copy of itself using an equivalence checker. We have found many inst...
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creator | Feinstein, D.Y. Thornton, M.A. Miller, D.M. |
description | This paper investigates partially redundant logic detection and gate modification coverage in both reversible and irreversible (classical) logic circuits. Our methodology is to repeatedly compare a benchmark circuit with a modified copy of itself using an equivalence checker. We have found many instances in the irreversible logic ISCAS85 benchmarks where single gate replacements were not detected, indicating no change in functionality after gate replacement. In contrast, we demonstrate that the Maslov reversible and quantum logic benchmarks exhibit very high gate modification fault coverage, in line with the expectation that reversible circuits, which implement bijective functions, have maximal information content. |
doi_str_mv | 10.1109/DATE.2008.4484932 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_4484932</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4484932</ieee_id><sourcerecordid>4484932</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-4787ccc0537ac2207a302b82fc74228fcebda7de6eb833a4b8eeb36a37f280dd3</originalsourceid><addsrcrecordid>eNpFkNtOwkAURcdbIqAfYHyZHyieuZTOPJICSkKiUXwmcznF0VJ02pLw95ZAwtNJ9tpZ2TmEPDAYMgb6aTJeToccQA2lVFILfkH6QisGCpjUl6TH0lQlXZVdnYGA6wMQkLBUs1vSr-tvAEgF1z3SvpnYBFOWe_qOvq28qRq62K6DoxNs0DVhW9HPOlRr-rHf2G3ZgelfG3amxMohzb_Q_RxoqDrBDmMdbInUVJ7OYzwHR2UeomtDU9-Rm8KUNd6f7oAsZ9Nl_pIsXp_n-XiRBA1NIjOVOee6pZlxnENmBHCreOEyybkqHFpvMo8jtEoII61CtGJkRFZwBd6LAXk8agMirn5j2Ji4X51eJ_4BBg9g7Q</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Partially Redundant Logic Detection Using Symbolic Equivalence Checking in Reversible and Irreversible Logic Circuits</title><source>IEEE Xplore All Conference Series</source><creator>Feinstein, D.Y. ; Thornton, M.A. ; Miller, D.M.</creator><creatorcontrib>Feinstein, D.Y. ; Thornton, M.A. ; Miller, D.M.</creatorcontrib><description>This paper investigates partially redundant logic detection and gate modification coverage in both reversible and irreversible (classical) logic circuits. Our methodology is to repeatedly compare a benchmark circuit with a modified copy of itself using an equivalence checker. We have found many instances in the irreversible logic ISCAS85 benchmarks where single gate replacements were not detected, indicating no change in functionality after gate replacement. In contrast, we demonstrate that the Maslov reversible and quantum logic benchmarks exhibit very high gate modification fault coverage, in line with the expectation that reversible circuits, which implement bijective functions, have maximal information content.</description><identifier>ISSN: 1530-1591</identifier><identifier>ISBN: 3981080130</identifier><identifier>ISBN: 9783981080131</identifier><identifier>EISSN: 1558-1101</identifier><identifier>EISBN: 3981080149</identifier><identifier>EISBN: 9783981080148</identifier><identifier>DOI: 10.1109/DATE.2008.4484932</identifier><language>eng</language><publisher>IEEE</publisher><subject>Automatic logic units ; Circuit simulation ; Circuit synthesis ; Circuit testing ; Computer science ; Logic circuits ; Logic design ; Logic gates ; Logic testing ; Redundancy</subject><ispartof>2008 Design, Automation and Test in Europe, 2008, p.1378-1381</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4484932$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4484932$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Feinstein, D.Y.</creatorcontrib><creatorcontrib>Thornton, M.A.</creatorcontrib><creatorcontrib>Miller, D.M.</creatorcontrib><title>Partially Redundant Logic Detection Using Symbolic Equivalence Checking in Reversible and Irreversible Logic Circuits</title><title>2008 Design, Automation and Test in Europe</title><addtitle>DATE</addtitle><description>This paper investigates partially redundant logic detection and gate modification coverage in both reversible and irreversible (classical) logic circuits. Our methodology is to repeatedly compare a benchmark circuit with a modified copy of itself using an equivalence checker. We have found many instances in the irreversible logic ISCAS85 benchmarks where single gate replacements were not detected, indicating no change in functionality after gate replacement. In contrast, we demonstrate that the Maslov reversible and quantum logic benchmarks exhibit very high gate modification fault coverage, in line with the expectation that reversible circuits, which implement bijective functions, have maximal information content.</description><subject>Automatic logic units</subject><subject>Circuit simulation</subject><subject>Circuit synthesis</subject><subject>Circuit testing</subject><subject>Computer science</subject><subject>Logic circuits</subject><subject>Logic design</subject><subject>Logic gates</subject><subject>Logic testing</subject><subject>Redundancy</subject><issn>1530-1591</issn><issn>1558-1101</issn><isbn>3981080130</isbn><isbn>9783981080131</isbn><isbn>3981080149</isbn><isbn>9783981080148</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFkNtOwkAURcdbIqAfYHyZHyieuZTOPJICSkKiUXwmcznF0VJ02pLw95ZAwtNJ9tpZ2TmEPDAYMgb6aTJeToccQA2lVFILfkH6QisGCpjUl6TH0lQlXZVdnYGA6wMQkLBUs1vSr-tvAEgF1z3SvpnYBFOWe_qOvq28qRq62K6DoxNs0DVhW9HPOlRr-rHf2G3ZgelfG3amxMohzb_Q_RxoqDrBDmMdbInUVJ7OYzwHR2UeomtDU9-Rm8KUNd6f7oAsZ9Nl_pIsXp_n-XiRBA1NIjOVOee6pZlxnENmBHCreOEyybkqHFpvMo8jtEoII61CtGJkRFZwBd6LAXk8agMirn5j2Ji4X51eJ_4BBg9g7Q</recordid><startdate>200803</startdate><enddate>200803</enddate><creator>Feinstein, D.Y.</creator><creator>Thornton, M.A.</creator><creator>Miller, D.M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200803</creationdate><title>Partially Redundant Logic Detection Using Symbolic Equivalence Checking in Reversible and Irreversible Logic Circuits</title><author>Feinstein, D.Y. ; Thornton, M.A. ; Miller, D.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-4787ccc0537ac2207a302b82fc74228fcebda7de6eb833a4b8eeb36a37f280dd3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Automatic logic units</topic><topic>Circuit simulation</topic><topic>Circuit synthesis</topic><topic>Circuit testing</topic><topic>Computer science</topic><topic>Logic circuits</topic><topic>Logic design</topic><topic>Logic gates</topic><topic>Logic testing</topic><topic>Redundancy</topic><toplevel>online_resources</toplevel><creatorcontrib>Feinstein, D.Y.</creatorcontrib><creatorcontrib>Thornton, M.A.</creatorcontrib><creatorcontrib>Miller, D.M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Feinstein, D.Y.</au><au>Thornton, M.A.</au><au>Miller, D.M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Partially Redundant Logic Detection Using Symbolic Equivalence Checking in Reversible and Irreversible Logic Circuits</atitle><btitle>2008 Design, Automation and Test in Europe</btitle><stitle>DATE</stitle><date>2008-03</date><risdate>2008</risdate><spage>1378</spage><epage>1381</epage><pages>1378-1381</pages><issn>1530-1591</issn><eissn>1558-1101</eissn><isbn>3981080130</isbn><isbn>9783981080131</isbn><eisbn>3981080149</eisbn><eisbn>9783981080148</eisbn><abstract>This paper investigates partially redundant logic detection and gate modification coverage in both reversible and irreversible (classical) logic circuits. Our methodology is to repeatedly compare a benchmark circuit with a modified copy of itself using an equivalence checker. We have found many instances in the irreversible logic ISCAS85 benchmarks where single gate replacements were not detected, indicating no change in functionality after gate replacement. In contrast, we demonstrate that the Maslov reversible and quantum logic benchmarks exhibit very high gate modification fault coverage, in line with the expectation that reversible circuits, which implement bijective functions, have maximal information content.</abstract><pub>IEEE</pub><doi>10.1109/DATE.2008.4484932</doi><tpages>4</tpages></addata></record> |
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ispartof | 2008 Design, Automation and Test in Europe, 2008, p.1378-1381 |
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language | eng |
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source | IEEE Xplore All Conference Series |
subjects | Automatic logic units Circuit simulation Circuit synthesis Circuit testing Computer science Logic circuits Logic design Logic gates Logic testing Redundancy |
title | Partially Redundant Logic Detection Using Symbolic Equivalence Checking in Reversible and Irreversible Logic Circuits |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T15%3A24%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Partially%20Redundant%20Logic%20Detection%20Using%20Symbolic%20Equivalence%20Checking%20in%20Reversible%20and%20Irreversible%20Logic%20Circuits&rft.btitle=2008%20Design,%20Automation%20and%20Test%20in%20Europe&rft.au=Feinstein,%20D.Y.&rft.date=2008-03&rft.spage=1378&rft.epage=1381&rft.pages=1378-1381&rft.issn=1530-1591&rft.eissn=1558-1101&rft.isbn=3981080130&rft.isbn_list=9783981080131&rft_id=info:doi/10.1109/DATE.2008.4484932&rft.eisbn=3981080149&rft.eisbn_list=9783981080148&rft_dat=%3Cieee_CHZPO%3E4484932%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-4787ccc0537ac2207a302b82fc74228fcebda7de6eb833a4b8eeb36a37f280dd3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4484932&rfr_iscdi=true |