Static fourier-spectrometer for solid surface studies in far infrared

The optical scheme and functioning of a static Fourier-transform (FT) spectrometer employing surface electromagnetic waves (SEW) at terahertz (THz) frequencies [A.A. Balashov et al., 2007] is discussed. The spectrometer enables one to obtain optical constants spectra of smooth metal surfaces as well...

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Main Authors: Balashov, A.A., Bogomolov, G.D., Kiryanov, A.P., Nikitin, A.K., Pustovoit, V.I., Vaguin, V.A., Zhizhin, G.N.
Format: Conference Proceeding
Language:English
Subjects:
Electromagnetic scattering
Frequency
Infrared spectra
Optical films
Optical pulses
Optical surface waves
Solids
Spectroscopy
Surface waves
Ultrafast optics
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creator Balashov, A.A.
Bogomolov, G.D.
Kiryanov, A.P.
Nikitin, A.K.
Pustovoit, V.I.
Vaguin, V.A.
Zhizhin, G.N.
description The optical scheme and functioning of a static Fourier-transform (FT) spectrometer employing surface electromagnetic waves (SEW) at terahertz (THz) frequencies [A.A. Balashov et al., 2007] is discussed. The spectrometer enables one to obtain optical constants spectra of smooth metal surfaces as well as those of super thin (up to nm thick) films on their surfaces. Ordinary for IR spectroscopy a band, with 3000 cm -1 width, including IR and THz ranges, could be obtained with femto-second laser pulse colored in 1600 cm -1 for very fast processes spectroscopic studies of surface with fs time resolution (in principal).
doi_str_mv 10.1109/ICIMW.2007.4516823
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ispartof 2007 Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics, 2007, p.991-992
issn 2162-2027
language eng
recordid cdi_ieee_primary_4516823
source IEEE Xplore All Conference Series
subjects Electromagnetic scattering
Frequency
Infrared spectra
Optical films
Optical pulses
Optical surface waves
Solids
Spectroscopy
Surface waves
Ultrafast optics
title Static fourier-spectrometer for solid surface studies in far infrared
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