Loading…
A Fourier Series-Based Analytical Solution for Three-Dimensional Conjugate Heat Transfer Problems in Microprocessor Cooling
A fully analytical steady state solution is presented for the problem of 3-D conjugate heat transfer in flip chip electronic packages with multiple general areal power sources, cooled by heatsinks using forced convection. The inherent simplicity of the proposed approach allows for expedient yet deta...
Saved in:
Published in: | IEEE transactions on components and packaging technologies 2008-06, Vol.31 (2), p.461-468 |
---|---|
Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c355t-3e7751621481045a54ec7dcb83314520ecc9adfcbc0a53d639a956820d2311313 |
---|---|
cites | cdi_FETCH-LOGICAL-c355t-3e7751621481045a54ec7dcb83314520ecc9adfcbc0a53d639a956820d2311313 |
container_end_page | 468 |
container_issue | 2 |
container_start_page | 461 |
container_title | IEEE transactions on components and packaging technologies |
container_volume | 31 |
creator | Ankireddi, S. Pecavar, S. |
description | A fully analytical steady state solution is presented for the problem of 3-D conjugate heat transfer in flip chip electronic packages with multiple general areal power sources, cooled by heatsinks using forced convection. The inherent simplicity of the proposed approach allows for expedient yet detailed package cooling/thermal analysis and evaluation of what-if scenarios while requiring only modest computational resources such as a personal computer. The soundness of the approach presented is demonstrated via excellent correlation with the results of experimental tests on flip-chip thermal test packages in a wind tunnel. The techniques developed herein are fairly general and can be readily adapted to other package designs wherein the primary heat transfer path is through the die, die-lid interface, lid, lid-sink interface and heatsink to the airflow through the fins. |
doi_str_mv | 10.1109/TCAPT.2008.921646 |
format | article |
fullrecord | <record><control><sourceid>proquest_ieee_</sourceid><recordid>TN_cdi_ieee_primary_4520010</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4520010</ieee_id><sourcerecordid>36341435</sourcerecordid><originalsourceid>FETCH-LOGICAL-c355t-3e7751621481045a54ec7dcb83314520ecc9adfcbc0a53d639a956820d2311313</originalsourceid><addsrcrecordid>eNp9kU1P3DAQhiNUpFLoD6h6sTi0p2xn_JHEx23KRyUQSKTnyOtMqFfZGOzkgPjzOCzi0ENPY3meeTXvvFn2BWGFCPpHU69vmxUHqFaaYyGLg-wIlSpzrUv-YXlzzIUQ-DH7FOMWAGUl9VH2vGbnfg6OArujVGL-00Tq2Ho0w9PkrBnYnR_myfmR9T6w5m8gyn-5HY0x_aV27cftfG8mYpdkJtYEM8Y-yd0GvxloF5kb2bWzwT8EbynGJFJ7P7jx_iQ77M0Q6fNbPc7-nJ819WV-dXPxu15f5VYoNeWCylJhwdPGCFIZJcmWnd1UyY1UHMhabbrebiwYJbpCaKNVUXHouEAUKI6z73vdtMHjTHFqdy5aGgYzkp9jW5UKZMmlSuS3_5KiEBKlWMDTf8BtumI6R1IrBABoLROEeyiZjzFQ3z4EtzPhqUVol9Ta19TaJbV2n1qa-bqfcUT0zi82AUG8AAgsk0c</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>863000994</pqid></control><display><type>article</type><title>A Fourier Series-Based Analytical Solution for Three-Dimensional Conjugate Heat Transfer Problems in Microprocessor Cooling</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Ankireddi, S. ; Pecavar, S.</creator><creatorcontrib>Ankireddi, S. ; Pecavar, S.</creatorcontrib><description>A fully analytical steady state solution is presented for the problem of 3-D conjugate heat transfer in flip chip electronic packages with multiple general areal power sources, cooled by heatsinks using forced convection. The inherent simplicity of the proposed approach allows for expedient yet detailed package cooling/thermal analysis and evaluation of what-if scenarios while requiring only modest computational resources such as a personal computer. The soundness of the approach presented is demonstrated via excellent correlation with the results of experimental tests on flip-chip thermal test packages in a wind tunnel. The techniques developed herein are fairly general and can be readily adapted to other package designs wherein the primary heat transfer path is through the die, die-lid interface, lid, lid-sink interface and heatsink to the airflow through the fins.</description><identifier>ISSN: 1521-3331</identifier><identifier>EISSN: 1557-9972</identifier><identifier>DOI: 10.1109/TCAPT.2008.921646</identifier><identifier>CODEN: ITCPFB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acoustic testing ; Analytical ; Conjugates ; Cooling ; Electronic packaging thermal management ; Electronics cooling ; Flip chip ; Fourier ; Heat sinks ; Heat transfer ; Mathematical analysis ; Mathematical models ; Microcomputers ; microprocessor ; Microprocessors ; package ; Packages ; Steady-state ; Wind ; Wind tunnels</subject><ispartof>IEEE transactions on components and packaging technologies, 2008-06, Vol.31 (2), p.461-468</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-3e7751621481045a54ec7dcb83314520ecc9adfcbc0a53d639a956820d2311313</citedby><cites>FETCH-LOGICAL-c355t-3e7751621481045a54ec7dcb83314520ecc9adfcbc0a53d639a956820d2311313</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4520010$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Ankireddi, S.</creatorcontrib><creatorcontrib>Pecavar, S.</creatorcontrib><title>A Fourier Series-Based Analytical Solution for Three-Dimensional Conjugate Heat Transfer Problems in Microprocessor Cooling</title><title>IEEE transactions on components and packaging technologies</title><addtitle>TCAPT</addtitle><description>A fully analytical steady state solution is presented for the problem of 3-D conjugate heat transfer in flip chip electronic packages with multiple general areal power sources, cooled by heatsinks using forced convection. The inherent simplicity of the proposed approach allows for expedient yet detailed package cooling/thermal analysis and evaluation of what-if scenarios while requiring only modest computational resources such as a personal computer. The soundness of the approach presented is demonstrated via excellent correlation with the results of experimental tests on flip-chip thermal test packages in a wind tunnel. The techniques developed herein are fairly general and can be readily adapted to other package designs wherein the primary heat transfer path is through the die, die-lid interface, lid, lid-sink interface and heatsink to the airflow through the fins.</description><subject>Acoustic testing</subject><subject>Analytical</subject><subject>Conjugates</subject><subject>Cooling</subject><subject>Electronic packaging thermal management</subject><subject>Electronics cooling</subject><subject>Flip chip</subject><subject>Fourier</subject><subject>Heat sinks</subject><subject>Heat transfer</subject><subject>Mathematical analysis</subject><subject>Mathematical models</subject><subject>Microcomputers</subject><subject>microprocessor</subject><subject>Microprocessors</subject><subject>package</subject><subject>Packages</subject><subject>Steady-state</subject><subject>Wind</subject><subject>Wind tunnels</subject><issn>1521-3331</issn><issn>1557-9972</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNp9kU1P3DAQhiNUpFLoD6h6sTi0p2xn_JHEx23KRyUQSKTnyOtMqFfZGOzkgPjzOCzi0ENPY3meeTXvvFn2BWGFCPpHU69vmxUHqFaaYyGLg-wIlSpzrUv-YXlzzIUQ-DH7FOMWAGUl9VH2vGbnfg6OArujVGL-00Tq2Ho0w9PkrBnYnR_myfmR9T6w5m8gyn-5HY0x_aV27cftfG8mYpdkJtYEM8Y-yd0GvxloF5kb2bWzwT8EbynGJFJ7P7jx_iQ77M0Q6fNbPc7-nJ819WV-dXPxu15f5VYoNeWCylJhwdPGCFIZJcmWnd1UyY1UHMhabbrebiwYJbpCaKNVUXHouEAUKI6z73vdtMHjTHFqdy5aGgYzkp9jW5UKZMmlSuS3_5KiEBKlWMDTf8BtumI6R1IrBABoLROEeyiZjzFQ3z4EtzPhqUVol9Ta19TaJbV2n1qa-bqfcUT0zi82AUG8AAgsk0c</recordid><startdate>20080601</startdate><enddate>20080601</enddate><creator>Ankireddi, S.</creator><creator>Pecavar, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20080601</creationdate><title>A Fourier Series-Based Analytical Solution for Three-Dimensional Conjugate Heat Transfer Problems in Microprocessor Cooling</title><author>Ankireddi, S. ; Pecavar, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-3e7751621481045a54ec7dcb83314520ecc9adfcbc0a53d639a956820d2311313</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Acoustic testing</topic><topic>Analytical</topic><topic>Conjugates</topic><topic>Cooling</topic><topic>Electronic packaging thermal management</topic><topic>Electronics cooling</topic><topic>Flip chip</topic><topic>Fourier</topic><topic>Heat sinks</topic><topic>Heat transfer</topic><topic>Mathematical analysis</topic><topic>Mathematical models</topic><topic>Microcomputers</topic><topic>microprocessor</topic><topic>Microprocessors</topic><topic>package</topic><topic>Packages</topic><topic>Steady-state</topic><topic>Wind</topic><topic>Wind tunnels</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ankireddi, S.</creatorcontrib><creatorcontrib>Pecavar, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on components and packaging technologies</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ankireddi, S.</au><au>Pecavar, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Fourier Series-Based Analytical Solution for Three-Dimensional Conjugate Heat Transfer Problems in Microprocessor Cooling</atitle><jtitle>IEEE transactions on components and packaging technologies</jtitle><stitle>TCAPT</stitle><date>2008-06-01</date><risdate>2008</risdate><volume>31</volume><issue>2</issue><spage>461</spage><epage>468</epage><pages>461-468</pages><issn>1521-3331</issn><eissn>1557-9972</eissn><coden>ITCPFB</coden><abstract>A fully analytical steady state solution is presented for the problem of 3-D conjugate heat transfer in flip chip electronic packages with multiple general areal power sources, cooled by heatsinks using forced convection. The inherent simplicity of the proposed approach allows for expedient yet detailed package cooling/thermal analysis and evaluation of what-if scenarios while requiring only modest computational resources such as a personal computer. The soundness of the approach presented is demonstrated via excellent correlation with the results of experimental tests on flip-chip thermal test packages in a wind tunnel. The techniques developed herein are fairly general and can be readily adapted to other package designs wherein the primary heat transfer path is through the die, die-lid interface, lid, lid-sink interface and heatsink to the airflow through the fins.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCAPT.2008.921646</doi><tpages>8</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1521-3331 |
ispartof | IEEE transactions on components and packaging technologies, 2008-06, Vol.31 (2), p.461-468 |
issn | 1521-3331 1557-9972 |
language | eng |
recordid | cdi_ieee_primary_4520010 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Acoustic testing Analytical Conjugates Cooling Electronic packaging thermal management Electronics cooling Flip chip Fourier Heat sinks Heat transfer Mathematical analysis Mathematical models Microcomputers microprocessor Microprocessors package Packages Steady-state Wind Wind tunnels |
title | A Fourier Series-Based Analytical Solution for Three-Dimensional Conjugate Heat Transfer Problems in Microprocessor Cooling |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T20%3A09%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Fourier%20Series-Based%20Analytical%20Solution%20for%20Three-Dimensional%20Conjugate%20Heat%20Transfer%20Problems%20in%20Microprocessor%20Cooling&rft.jtitle=IEEE%20transactions%20on%20components%20and%20packaging%20technologies&rft.au=Ankireddi,%20S.&rft.date=2008-06-01&rft.volume=31&rft.issue=2&rft.spage=461&rft.epage=468&rft.pages=461-468&rft.issn=1521-3331&rft.eissn=1557-9972&rft.coden=ITCPFB&rft_id=info:doi/10.1109/TCAPT.2008.921646&rft_dat=%3Cproquest_ieee_%3E36341435%3C/proquest_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c355t-3e7751621481045a54ec7dcb83314520ecc9adfcbc0a53d639a956820d2311313%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=863000994&rft_id=info:pmid/&rft_ieee_id=4520010&rfr_iscdi=true |