Bridging Fault Test Method With Adaptive Power Management Awareness

A key design constraint of circuits used in hand-held devices is the power consumption, mainly due to battery-life limitations. Adaptive power management (APM) techniques aim at increasing the battery life of such devices by adjusting the supply voltage and operating frequency, and thus the power co...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 2008-06, Vol.27 (6), p.1117-1127
Main Authors: Khursheed, S., Ingelsson, U., Rosinger, P., Al-Hashimi, B.M., Harrod, P.
Format: Article
Language:English
Subjects:
Adaptive power management (APM)
Automatic testing
Battery management systems
Bridging
Circuit faults
Circuit testing
Circuits
Costs
Defects
Design engineering
Devices
Electric potential
Energy consumption
Energy management
Frequency
Integrated circuits
Management
resistive bridging faults (RBFs)
System testing
test generation
test points
Voltage
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Summary:A key design constraint of circuits used in hand-held devices is the power consumption, mainly due to battery-life limitations. Adaptive power management (APM) techniques aim at increasing the battery life of such devices by adjusting the supply voltage and operating frequency, and thus the power consumption, according to the workload. Testing for resistive bridging defects in APM-enabled designs raises a number of challenges due to their complex analog behavior. Testing at more than one supply voltage setting can be employed to improve defect coverage in such systems; however, switching between several supply voltage settings has a detrimental impact on the overall cost of test. This paper proposes a multi- automatic test generation method which delivers 100% resistive bridging defect coverage and also a way of reducing the number of supply voltage settings required during test through test point insertion. The proposed techniques have been experimentally validated using a number of benchmark circuits.
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2008.923247