Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability

A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 2008-07, Vol.27 (7), p.1333-1338
Main Authors: Kavousianos, X., Kalligeros, E., Nikolos, D.
Format: Article
Language:English
Subjects:
Circuit testing
Compressed
Computer aided design
Computer architecture
Computer science
Data compression
Design engineering
Embedded testing techniques
Encoding
Hardware
Huffman encoding
Intellectual property
intellectual property (IP) cores
IP (Internet Protocol)
Statistical tests
System testing
System-on-a-chip
Systems engineering and theory
Test data compression
Transformations
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Summary:A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is partitioned into variable-length blocks, which are, then, compressed by an efficient Huffman-based encoding procedure with a limited number of codewords. To increase the compression ratio, the same codeword can be reused for encoding compatible blocks of different sizes. Further compression improvements can be achieved by using two very simple test set transformations. A simple and low-overhead decompression architecture is also proposed.
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2008.923100