Multi-scale modeling of low dose-rate total dose effects in advanced microelectronics

Multi-scale approach based on physical, circuit and system levels for radiation effects modeling is considered. The model of low dose rate sensitivity of subthreshold leakage current is presented. Parameters for SPICE simulation can be obtained.

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Bibliographic Details
Main Authors: Zebrev, G.I., Gorbunov, M.S., Osipenko, P.N.
Format: Conference Proceeding
Language:English
Subjects:
Circuit simulation
Circuits and systems
Computational modeling
Electron traps
Leakage current
Microelectronics
Physics
Radiation effects
Space technology
Threshold voltage
Online Access:Request full text
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Description
Summary:Multi-scale approach based on physical, circuit and system levels for radiation effects modeling is considered. The model of low dose rate sensitivity of subthreshold leakage current is presented. Parameters for SPICE simulation can be obtained.
DOI:10.1109/ICMEL.2008.4559355