Analysis of the effects of high-energy electrons on a low earth orbit satellite parts

This study aims to analyze the effects of high-energy electrons, which are cosmic radiation, on satellite parts. In general, a satellite revolving at a low altitude passes through the Van Allen belt. In the belt, electronic parts of the satellite are damaged and their life is shortened by charged pa...

Full description

Saved in:
Bibliographic Details
Main Authors: Chung, S.I., Lee, H.H.
Format: Conference Proceeding
Language:English
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 702
container_issue
container_start_page 700
container_title
container_volume
creator Chung, S.I.
Lee, H.H.
description This study aims to analyze the effects of high-energy electrons, which are cosmic radiation, on satellite parts. In general, a satellite revolving at a low altitude passes through the Van Allen belt. In the belt, electronic parts of the satellite are damaged and their life is shortened by charged particles drifting toward the south pole and the north pole through cyclic movement. In particular, SEU (single event upset) by radiation causes the malfunction of semiconductor elements in satellites. The present study irradiated an electron beam on solar cells using a 1 MeV electron beam accelerator and measured the values of parameters changed by the irradiation. In addition, we made comparative analysis with ground experiment using variation in short circuit current measured at solar cells for the attitude control of STSAT-1 and electron flux observed in the NOAA POES Satellite. The results of this study are expected to be useful in understanding the impact of radiation on solar cells for power generation in low altitude satellites.
doi_str_mv 10.1109/INDIN.2008.4618191
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4618191</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4618191</ieee_id><sourcerecordid>4618191</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-17efa7898d06809f7af30bed8c2c92ce24428f714e8bd46b86dfdb8b93878f643</originalsourceid><addsrcrecordid>eNo1kMtqwzAURNUXNEnzA-1GP-BU15Klq2VIX4GQblLoLsj2Vazi2sESlPx90zZdDTMHhmEYuwUxAxD2frl-WK5nuRA4UxoQLJyxMahcqRwMyHM2yqXBTGr5fsGm1uA_E3DJRmBlkanC6Gs2jvFDiKIApUfsbd659hBD5L3nqSFO3lOVfm0Tdk1GHQ27A6f2mA59dwQdd7ztvzi5ITW8H8qQeHSJ2jYk4vtjGm_YlXdtpOlJJ2zz9LhZvGSr1-flYr7KghUpA0PeGbRYC43CeuO8FCXVWOWVzSv6mY_egCIsa6VL1LWvSyytRINeKzlhd3-1gYi2-yF8uuGwPb0jvwEewlWO</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Analysis of the effects of high-energy electrons on a low earth orbit satellite parts</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Chung, S.I. ; Lee, H.H.</creator><creatorcontrib>Chung, S.I. ; Lee, H.H.</creatorcontrib><description>This study aims to analyze the effects of high-energy electrons, which are cosmic radiation, on satellite parts. In general, a satellite revolving at a low altitude passes through the Van Allen belt. In the belt, electronic parts of the satellite are damaged and their life is shortened by charged particles drifting toward the south pole and the north pole through cyclic movement. In particular, SEU (single event upset) by radiation causes the malfunction of semiconductor elements in satellites. The present study irradiated an electron beam on solar cells using a 1 MeV electron beam accelerator and measured the values of parameters changed by the irradiation. In addition, we made comparative analysis with ground experiment using variation in short circuit current measured at solar cells for the attitude control of STSAT-1 and electron flux observed in the NOAA POES Satellite. The results of this study are expected to be useful in understanding the impact of radiation on solar cells for power generation in low altitude satellites.</description><identifier>ISSN: 1935-4576</identifier><identifier>ISBN: 9781424421701</identifier><identifier>ISBN: 1424421705</identifier><identifier>EISSN: 2378-363X</identifier><identifier>EISBN: 1424421713</identifier><identifier>EISBN: 9781424421718</identifier><identifier>DOI: 10.1109/INDIN.2008.4618191</identifier><language>eng</language><publisher>IEEE</publisher><ispartof>2008 6th IEEE International Conference on Industrial Informatics, 2008, p.700-702</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4618191$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4618191$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chung, S.I.</creatorcontrib><creatorcontrib>Lee, H.H.</creatorcontrib><title>Analysis of the effects of high-energy electrons on a low earth orbit satellite parts</title><title>2008 6th IEEE International Conference on Industrial Informatics</title><addtitle>INDIN</addtitle><description>This study aims to analyze the effects of high-energy electrons, which are cosmic radiation, on satellite parts. In general, a satellite revolving at a low altitude passes through the Van Allen belt. In the belt, electronic parts of the satellite are damaged and their life is shortened by charged particles drifting toward the south pole and the north pole through cyclic movement. In particular, SEU (single event upset) by radiation causes the malfunction of semiconductor elements in satellites. The present study irradiated an electron beam on solar cells using a 1 MeV electron beam accelerator and measured the values of parameters changed by the irradiation. In addition, we made comparative analysis with ground experiment using variation in short circuit current measured at solar cells for the attitude control of STSAT-1 and electron flux observed in the NOAA POES Satellite. The results of this study are expected to be useful in understanding the impact of radiation on solar cells for power generation in low altitude satellites.</description><issn>1935-4576</issn><issn>2378-363X</issn><isbn>9781424421701</isbn><isbn>1424421705</isbn><isbn>1424421713</isbn><isbn>9781424421718</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo1kMtqwzAURNUXNEnzA-1GP-BU15Klq2VIX4GQblLoLsj2Vazi2sESlPx90zZdDTMHhmEYuwUxAxD2frl-WK5nuRA4UxoQLJyxMahcqRwMyHM2yqXBTGr5fsGm1uA_E3DJRmBlkanC6Gs2jvFDiKIApUfsbd659hBD5L3nqSFO3lOVfm0Tdk1GHQ27A6f2mA59dwQdd7ztvzi5ITW8H8qQeHSJ2jYk4vtjGm_YlXdtpOlJJ2zz9LhZvGSr1-flYr7KghUpA0PeGbRYC43CeuO8FCXVWOWVzSv6mY_egCIsa6VL1LWvSyytRINeKzlhd3-1gYi2-yF8uuGwPb0jvwEewlWO</recordid><startdate>200807</startdate><enddate>200807</enddate><creator>Chung, S.I.</creator><creator>Lee, H.H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200807</creationdate><title>Analysis of the effects of high-energy electrons on a low earth orbit satellite parts</title><author>Chung, S.I. ; Lee, H.H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-17efa7898d06809f7af30bed8c2c92ce24428f714e8bd46b86dfdb8b93878f643</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Chung, S.I.</creatorcontrib><creatorcontrib>Lee, H.H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chung, S.I.</au><au>Lee, H.H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Analysis of the effects of high-energy electrons on a low earth orbit satellite parts</atitle><btitle>2008 6th IEEE International Conference on Industrial Informatics</btitle><stitle>INDIN</stitle><date>2008-07</date><risdate>2008</risdate><spage>700</spage><epage>702</epage><pages>700-702</pages><issn>1935-4576</issn><eissn>2378-363X</eissn><isbn>9781424421701</isbn><isbn>1424421705</isbn><eisbn>1424421713</eisbn><eisbn>9781424421718</eisbn><abstract>This study aims to analyze the effects of high-energy electrons, which are cosmic radiation, on satellite parts. In general, a satellite revolving at a low altitude passes through the Van Allen belt. In the belt, electronic parts of the satellite are damaged and their life is shortened by charged particles drifting toward the south pole and the north pole through cyclic movement. In particular, SEU (single event upset) by radiation causes the malfunction of semiconductor elements in satellites. The present study irradiated an electron beam on solar cells using a 1 MeV electron beam accelerator and measured the values of parameters changed by the irradiation. In addition, we made comparative analysis with ground experiment using variation in short circuit current measured at solar cells for the attitude control of STSAT-1 and electron flux observed in the NOAA POES Satellite. The results of this study are expected to be useful in understanding the impact of radiation on solar cells for power generation in low altitude satellites.</abstract><pub>IEEE</pub><doi>10.1109/INDIN.2008.4618191</doi><tpages>3</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1935-4576
ispartof 2008 6th IEEE International Conference on Industrial Informatics, 2008, p.700-702
issn 1935-4576
2378-363X
language eng
recordid cdi_ieee_primary_4618191
source IEEE Electronic Library (IEL) Conference Proceedings
title Analysis of the effects of high-energy electrons on a low earth orbit satellite parts
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T20%3A52%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Analysis%20of%20the%20effects%20of%20high-energy%20electrons%20on%20a%20low%20earth%20orbit%20satellite%20parts&rft.btitle=2008%206th%20IEEE%20International%20Conference%20on%20Industrial%20Informatics&rft.au=Chung,%20S.I.&rft.date=2008-07&rft.spage=700&rft.epage=702&rft.pages=700-702&rft.issn=1935-4576&rft.eissn=2378-363X&rft.isbn=9781424421701&rft.isbn_list=1424421705&rft_id=info:doi/10.1109/INDIN.2008.4618191&rft.eisbn=1424421713&rft.eisbn_list=9781424421718&rft_dat=%3Cieee_6IE%3E4618191%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-17efa7898d06809f7af30bed8c2c92ce24428f714e8bd46b86dfdb8b93878f643%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4618191&rfr_iscdi=true