The new BIPM 1-V reference standard based on an array of Josephson junctions

The authors report the first measurements at the Bureau International des Poids et Mesures (BIPM) with a 1-V reference standard based on an array of Josephson junctions. A novel procedure for standard cell measurements is described. It allows the measurement of a cell electromotive force (EMF) with...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 1989-12, Vol.38 (6), p.1030-1035
Main Authors: Reymann, D., Witt, T.J.
Format: Article
Language:English
Subjects:
426001 - Engineering- Superconducting Devices & Circuits- (1990-)
Applied sciences
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
ELECTROMOTIVE FORCE
Electronics
Exact sciences and technology
Force measurement
Instruments
Joining processes
Josephson effect
JOSEPHSON JUNCTIONS
JUNCTIONS
Lead compounds
Measurement standards
MEASURING METHODS
Standards development
SUPERCONDUCTING JUNCTIONS
Testing, measurement, noise and reliability
Uncertainty
Voltage
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Summary:The authors report the first measurements at the Bureau International des Poids et Mesures (BIPM) with a 1-V reference standard based on an array of Josephson junctions. A novel procedure for standard cell measurements is described. It allows the measurement of a cell electromotive force (EMF) with a random uncertainty of less than 1 nV and a total uncertainty of about 2 nV while avoiding direct connection of the cell to the array. Comparisons with an older Josephson reference standard, which is based on a junction output of 10 mV, were made both indirectly by means of standard cells and directly by connecting the instruments together. The results and the random uncertainties imply that the value assigned to a standard cell using the array minus that given by the older apparatus is -18.8+or-3.4 nV for the indirect method and -17.1+or-1.5 nV for the direct method. Taking into account the estimated total uncertainty of 23.5 nV for the old system, the agreement is excellent.< >
ISSN:0018-9456
1557-9662
DOI:10.1109/19.46396