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The influence of sensitivity coefficient on the performance of microwave devices
Mechanical tolerances of microwave devices (MDS) introduced by the manufacturing process lead to a variation in the device performance. To obtain this variation by repeated experiments of large numbers of randomly perturbed geometries is excessively costly. An alternative is to find the changing rul...
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creator | Yuemin Ning Wanshun Jiang |
description | Mechanical tolerances of microwave devices (MDS) introduced by the manufacturing process lead to a variation in the device performance. To obtain this variation by repeated experiments of large numbers of randomly perturbed geometries is excessively costly. An alternative is to find the changing rule of the performance with respect to each geometric variable. This paper gives a method of calculating the sensitivity coefficient of mechanical tolerances (SCMTS) of MDS. The method is clear in thought and convenient in application. It can figure out the change of the performance of the MDS due to the variation of the mechanical tolerances (VMTS). Taking the air coaxial line (ACL) as an example, the paper discusses the calculating method of SCMTS, gives the expression of the SCMTS and computes the quantity of the VMTS. In point of designing the MDS, the theoretic directive significance of the SCMTS is obvious. |
doi_str_mv | 10.1109/ICCCAS.2008.4657736 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4657736</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4657736</ieee_id><sourcerecordid>4657736</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-b11c9e93cfd4c10db3ea61a38abaf5b7167eba0baf462c0d88002b13d1344993</originalsourceid><addsrcrecordid>eNo1kMtqwzAURFVKoE3qL8hGP2D3yrqWrWUwfQQCLST7IMlXVCW2g-W65O-bUnc2w4HDLIaxtYBMCNCP27quN_ssB6gyVEVZSnXDlgJzxBwU4i1LdFn9s1QLtvx1NYAEcceSGD_hGiwkQnHP3g8fxEPnT1_UOeK955G6GMYwhfHCXU_eBxeoG3nf8fHqnmnw_dCa2W6DG_pvMxFvaAqO4gNbeHOKlMy9Yvvnp0P9mu7eXrb1ZpcGDWNqhXCatHS-QSegsZKMEkZWxhpf2FKokqyBK6DKHTRVBZBbIRshEbWWK7b-Ww1EdDwPoTXD5Tj_IX8ASDBTSA</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>The influence of sensitivity coefficient on the performance of microwave devices</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Yuemin Ning ; Wanshun Jiang</creator><creatorcontrib>Yuemin Ning ; Wanshun Jiang</creatorcontrib><description>Mechanical tolerances of microwave devices (MDS) introduced by the manufacturing process lead to a variation in the device performance. To obtain this variation by repeated experiments of large numbers of randomly perturbed geometries is excessively costly. An alternative is to find the changing rule of the performance with respect to each geometric variable. This paper gives a method of calculating the sensitivity coefficient of mechanical tolerances (SCMTS) of MDS. The method is clear in thought and convenient in application. It can figure out the change of the performance of the MDS due to the variation of the mechanical tolerances (VMTS). Taking the air coaxial line (ACL) as an example, the paper discusses the calculating method of SCMTS, gives the expression of the SCMTS and computes the quantity of the VMTS. In point of designing the MDS, the theoretic directive significance of the SCMTS is obvious.</description><identifier>ISBN: 9781424420636</identifier><identifier>ISBN: 1424420636</identifier><identifier>EISBN: 1424420644</identifier><identifier>EISBN: 9781424420643</identifier><identifier>DOI: 10.1109/ICCCAS.2008.4657736</identifier><identifier>LCCN: 2008900301</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductors ; Distance measurement ; Geometry ; Manufacturing processes ; Microwave circuits ; Performance evaluation ; Sensitivity</subject><ispartof>2008 International Conference on Communications, Circuits and Systems, 2008, p.97-100</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4657736$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4657736$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Yuemin Ning</creatorcontrib><creatorcontrib>Wanshun Jiang</creatorcontrib><title>The influence of sensitivity coefficient on the performance of microwave devices</title><title>2008 International Conference on Communications, Circuits and Systems</title><addtitle>ICCCAS</addtitle><description>Mechanical tolerances of microwave devices (MDS) introduced by the manufacturing process lead to a variation in the device performance. To obtain this variation by repeated experiments of large numbers of randomly perturbed geometries is excessively costly. An alternative is to find the changing rule of the performance with respect to each geometric variable. This paper gives a method of calculating the sensitivity coefficient of mechanical tolerances (SCMTS) of MDS. The method is clear in thought and convenient in application. It can figure out the change of the performance of the MDS due to the variation of the mechanical tolerances (VMTS). Taking the air coaxial line (ACL) as an example, the paper discusses the calculating method of SCMTS, gives the expression of the SCMTS and computes the quantity of the VMTS. In point of designing the MDS, the theoretic directive significance of the SCMTS is obvious.</description><subject>Conductors</subject><subject>Distance measurement</subject><subject>Geometry</subject><subject>Manufacturing processes</subject><subject>Microwave circuits</subject><subject>Performance evaluation</subject><subject>Sensitivity</subject><isbn>9781424420636</isbn><isbn>1424420636</isbn><isbn>1424420644</isbn><isbn>9781424420643</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo1kMtqwzAURFVKoE3qL8hGP2D3yrqWrWUwfQQCLST7IMlXVCW2g-W65O-bUnc2w4HDLIaxtYBMCNCP27quN_ssB6gyVEVZSnXDlgJzxBwU4i1LdFn9s1QLtvx1NYAEcceSGD_hGiwkQnHP3g8fxEPnT1_UOeK955G6GMYwhfHCXU_eBxeoG3nf8fHqnmnw_dCa2W6DG_pvMxFvaAqO4gNbeHOKlMy9Yvvnp0P9mu7eXrb1ZpcGDWNqhXCatHS-QSegsZKMEkZWxhpf2FKokqyBK6DKHTRVBZBbIRshEbWWK7b-Ww1EdDwPoTXD5Tj_IX8ASDBTSA</recordid><startdate>200805</startdate><enddate>200805</enddate><creator>Yuemin Ning</creator><creator>Wanshun Jiang</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200805</creationdate><title>The influence of sensitivity coefficient on the performance of microwave devices</title><author>Yuemin Ning ; Wanshun Jiang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-b11c9e93cfd4c10db3ea61a38abaf5b7167eba0baf462c0d88002b13d1344993</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Conductors</topic><topic>Distance measurement</topic><topic>Geometry</topic><topic>Manufacturing processes</topic><topic>Microwave circuits</topic><topic>Performance evaluation</topic><topic>Sensitivity</topic><toplevel>online_resources</toplevel><creatorcontrib>Yuemin Ning</creatorcontrib><creatorcontrib>Wanshun Jiang</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yuemin Ning</au><au>Wanshun Jiang</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The influence of sensitivity coefficient on the performance of microwave devices</atitle><btitle>2008 International Conference on Communications, Circuits and Systems</btitle><stitle>ICCCAS</stitle><date>2008-05</date><risdate>2008</risdate><spage>97</spage><epage>100</epage><pages>97-100</pages><isbn>9781424420636</isbn><isbn>1424420636</isbn><eisbn>1424420644</eisbn><eisbn>9781424420643</eisbn><abstract>Mechanical tolerances of microwave devices (MDS) introduced by the manufacturing process lead to a variation in the device performance. To obtain this variation by repeated experiments of large numbers of randomly perturbed geometries is excessively costly. An alternative is to find the changing rule of the performance with respect to each geometric variable. This paper gives a method of calculating the sensitivity coefficient of mechanical tolerances (SCMTS) of MDS. The method is clear in thought and convenient in application. It can figure out the change of the performance of the MDS due to the variation of the mechanical tolerances (VMTS). Taking the air coaxial line (ACL) as an example, the paper discusses the calculating method of SCMTS, gives the expression of the SCMTS and computes the quantity of the VMTS. In point of designing the MDS, the theoretic directive significance of the SCMTS is obvious.</abstract><pub>IEEE</pub><doi>10.1109/ICCCAS.2008.4657736</doi><tpages>4</tpages></addata></record> |
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subjects | Conductors Distance measurement Geometry Manufacturing processes Microwave circuits Performance evaluation Sensitivity |
title | The influence of sensitivity coefficient on the performance of microwave devices |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T09%3A44%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=The%20influence%20of%20sensitivity%20coefficient%20on%20the%20performance%20of%20microwave%20devices&rft.btitle=2008%20International%20Conference%20on%20Communications,%20Circuits%20and%20Systems&rft.au=Yuemin%20Ning&rft.date=2008-05&rft.spage=97&rft.epage=100&rft.pages=97-100&rft.isbn=9781424420636&rft.isbn_list=1424420636&rft_id=info:doi/10.1109/ICCCAS.2008.4657736&rft.eisbn=1424420644&rft.eisbn_list=9781424420643&rft_dat=%3Cieee_6IE%3E4657736%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-b11c9e93cfd4c10db3ea61a38abaf5b7167eba0baf462c0d88002b13d1344993%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4657736&rfr_iscdi=true |