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The influence of dielectric resonator conductive surface impedance on the resonator spectral and energy characteristics
The impedance influence on complex frequencies of hemispherical dielectric resonators has been studied. The expressions for determination of conductor inclusion factor were obtained. The numerical investigations for a Teflon hemispherical resonator with plane surfaces made of different conductors ha...
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creator | Filipov, Yu.F. Prokopenko, Yu.V. Shipilova, I.A. |
description | The impedance influence on complex frequencies of hemispherical dielectric resonators has been studied. The expressions for determination of conductor inclusion factor were obtained. The numerical investigations for a Teflon hemispherical resonator with plane surfaces made of different conductors have been made. |
doi_str_mv | 10.1109/CRMICO.2008.4676466 |
format | conference_proceeding |
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The expressions for determination of conductor inclusion factor were obtained. 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The numerical investigations for a Teflon hemispherical resonator with plane surfaces made of different conductors have been made.</description><subject>Dielectrics</subject><subject>Helium</subject><subject>Optimized production technology</subject><subject>Page description languages</subject><subject>Surface impedance</subject><subject>Tellurium</subject><isbn>9663351667</isbn><isbn>9789663351667</isbn><isbn>9789663351698</isbn><isbn>9663351691</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFkN1KAzEUhCMiqLVP0Ju8QOvJZpNsLmXxp1ApSO_LafbERrbZkqSKb2_VilfDwMwHM4xNBMyEAHvbvjzP2-WsAmhmtTa61vqMja1prNZSKqFtc86u_4w2l2yc8xsACKsNqOqKfay2xEP0_YGiIz543gXqyZUUHE-Uh4hlSNwNsTu4Et6J50PyeIyG3Z46_ClFXo6U_3TefwOw5xg7TpHS6yd3W0zoCqWQS3D5hl147DONTzpiq4f7Vfs0XSwf5-3dYhoslKlVpI2U1tcWmo0H7JSvrLREppIGUXj0ShGQllhL06BCB9arjdggdsfZIzb5xQYiWu9T2GH6XJ-ukl9NLWD3</recordid><startdate>200809</startdate><enddate>200809</enddate><creator>Filipov, Yu.F.</creator><creator>Prokopenko, Yu.V.</creator><creator>Shipilova, I.A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200809</creationdate><title>The influence of dielectric resonator conductive surface impedance on the resonator spectral and energy characteristics</title><author>Filipov, Yu.F. ; Prokopenko, Yu.V. ; Shipilova, I.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-95e67339f4908bf0ad5f2939ee7237aa1faf55e0e63a4378a5ac09f5b1baad663</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Dielectrics</topic><topic>Helium</topic><topic>Optimized production technology</topic><topic>Page description languages</topic><topic>Surface impedance</topic><topic>Tellurium</topic><toplevel>online_resources</toplevel><creatorcontrib>Filipov, Yu.F.</creatorcontrib><creatorcontrib>Prokopenko, Yu.V.</creatorcontrib><creatorcontrib>Shipilova, I.A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Filipov, Yu.F.</au><au>Prokopenko, Yu.V.</au><au>Shipilova, I.A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The influence of dielectric resonator conductive surface impedance on the resonator spectral and energy characteristics</atitle><btitle>2008 18th International Crimean Conference - Microwave & Telecommunication Technology</btitle><stitle>CRMICO</stitle><date>2008-09</date><risdate>2008</risdate><spage>480</spage><epage>481</epage><pages>480-481</pages><isbn>9663351667</isbn><isbn>9789663351667</isbn><eisbn>9789663351698</eisbn><eisbn>9663351691</eisbn><abstract>The impedance influence on complex frequencies of hemispherical dielectric resonators has been studied. The expressions for determination of conductor inclusion factor were obtained. The numerical investigations for a Teflon hemispherical resonator with plane surfaces made of different conductors have been made.</abstract><pub>IEEE</pub><doi>10.1109/CRMICO.2008.4676466</doi><tpages>2</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Dielectrics Helium Optimized production technology Page description languages Surface impedance Tellurium |
title | The influence of dielectric resonator conductive surface impedance on the resonator spectral and energy characteristics |
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