Low cost testing of multi-GBit device pins with ATE assisted loopback instrument

Loopback has always been a choice in testing multi-GBit device pins. It typically involves compromise in test coverage. This paper describes an instrument providing low-cost test capability for these pins which eliminates test compromises.

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Bibliographic Details
Main Authors: Fritzsche, W.A., Haque, A.E.
Format: Conference Proceeding
Language:English
Subjects:
Built-in self-test
Circuit testing
Costs
Hardware
Instruments
Jitter
Pins
Power system modeling
Protocols
System testing
Online Access:Request full text
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Description
Summary:Loopback has always been a choice in testing multi-GBit device pins. It typically involves compromise in test coverage. This paper describes an instrument providing low-cost test capability for these pins which eliminates test compromises.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2008.4700558