Implementation Update: Logic Mapping On SPARC- Microprocessors

Despite the initial proof of concept being completed almost a decade ago, the production implementations of Logic Mapping have taken significantly longer. This paper presents an update for the SPARCtrade Microprocessors, along with a discussion of some production worthiness metrics and methods appli...

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Bibliographic Details
Main Authors: Vij, A., Ratliff, R.
Format: Conference Proceeding
Language:English
Subjects:
Automatic test pattern generation
Availability
Inspection
Logic devices
Manufacturing
Microprocessors
Packaging
Production
Testing
Wafer scale integration
Online Access:Request full text
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Description
Summary:Despite the initial proof of concept being completed almost a decade ago, the production implementations of Logic Mapping have taken significantly longer. This paper presents an update for the SPARCtrade Microprocessors, along with a discussion of some production worthiness metrics and methods applied to overcome issues on these designs. Statistical wafer level results from three current 65 nm products are shown, supplemented by analysis of some interesting packaged units.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2008.4700560