Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality

With test quality being an imperative, this paper presents a methodology on how to apply volume scan diagnosis - known from the field of yield learning - to the domain of test quality learning. Volume diagnosis allows to drastically accelerate the learning cycle. We give guidelines on how to improve...

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Bibliographic Details
Main Authors: Eichenberger, S., Geuzebroek, J., Hora, C., Kruseman, B., Majhi, A.
Format: Conference Proceeding
Language:eng ; jpn
Subjects:
Acceleration
Automatic test pattern generation
Circuit faults
Data analysis
Fault diagnosis
Guidelines
Mass production
Pattern analysis
Semiconductor device testing
Test pattern generators
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Description
Summary:With test quality being an imperative, this paper presents a methodology on how to apply volume scan diagnosis - known from the field of yield learning - to the domain of test quality learning. Volume diagnosis allows to drastically accelerate the learning cycle. We give guidelines on how to improve test pattern generation strategies and try to answer which defects can be addressed deterministically with adequate fault models versus where probabilistic methods such as N-detect need be applied. The paper is based on a detailed analysis of scan diagnosis data from a production volume of well over one million devices of a 90 nm product.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2008.4700604