The noise of MOS magnetic microsensors structures

The paper presents the results of research work regarding the analysis and optimization of magnetic microsensor structures realized in MOS integrated circuits technology. By assimilating the MOSFET channel of almost constant depth with a Hall plate, the results obtained for the conventional Hall pla...

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Bibliographic Details
Main Authors: Panait, C., Caruntu, G.
Format: Conference Proceeding
Language:English
Subjects:
detection limit
Geometry
Integrated circuit noise
Integrated circuit technology
Magnetic analysis
Magnetic materials
Magnetic noise
Micromagnetics
MOS integrated circuits
MOSFET circuits
noise-equivalent magnetic induction
Paper technology
signal-to-noise ratio
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Description
Summary:The paper presents the results of research work regarding the analysis and optimization of magnetic microsensor structures realized in MOS integrated circuits technology. By assimilating the MOSFET channel of almost constant depth with a Hall plate, the results obtained for the conventional Hall plates have been extended to MOS-Hall plates. On the basis of adequate models there have been established the noise main characteristics for bipolar lateral magnetotransistor, where the current deflection effect is dominating. An analysis of the devices characteristics in respect with the channel geometry and the material features has therefore been achieved for the first time.
ISSN:1545-827X
2377-0678
DOI:10.1109/SMICND.2008.4703370