XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults

In this paper, we propose a new test generation method for delay faults considering crosstalk-induced delay effects, based on a conventional delay ATPG technique in order to reduce the complexity of previous ATPG algorithm for crosstalk delay faults and to consider multiple aggressor crosstalk fault...

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Bibliographic Details
Main Authors: Sunghoon Chun, Yongjoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang
Format: Conference Proceeding
Language:English
Subjects:
ATPG
Automatic test pattern generation
Circuit faults
Circuit noise
Circuit testing
Crosstalk
Crosstalk delay faults
Delay effects
Electronic equipment testing
Noise generators
Path delay faults
Test pattern generators
Timing
Timing analysis
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Description
Summary:In this paper, we propose a new test generation method for delay faults considering crosstalk-induced delay effects, based on a conventional delay ATPG technique in order to reduce the complexity of previous ATPG algorithm for crosstalk delay faults and to consider multiple aggressor crosstalk faults to maximize the noise of the victim line. Since the proposed ATPG for crosstalk-induced delay faults uses the physical and timing information, the proposed ATPG can reduce the search space of the backward implication of the aggressor's constraints and it is helpful for reducing the time cost of the ATPG than previous works. In addition, since the proposed technique targets on the critical path for the original delay test as the victim lines, it can improve test effectiveness of delay testing. Experimental results demonstrate the effectiveness of the proposed method.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2008.57