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Goos-Häanchen shift at the surface of chiral negative refractive media
The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive w...
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creator | Dong, W.T. Gao, L. Qiu, C.W. |
description | The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle. |
doi_str_mv | 10.1109/META.2008.4723538 |
format | conference_proceeding |
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GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle.</description><identifier>ISBN: 9781424426089</identifier><identifier>ISBN: 1424426081</identifier><identifier>EISBN: 9781424426096</identifier><identifier>EISBN: 142442609X</identifier><identifier>DOI: 10.1109/META.2008.4723538</identifier><identifier>LCCN: 2008904868</identifier><language>eng</language><publisher>IEEE</publisher><subject>Boundary conditions ; Dielectrics ; Geometrical optics ; Optical devices ; Optical refraction ; Optical sensors ; Optical surface waves ; Optical waveguides ; Polarization ; Reflection</subject><ispartof>2008 International Workshop on Metamaterials, 2008, p.77-80</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4723538$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4723538$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Dong, W.T.</creatorcontrib><creatorcontrib>Gao, L.</creatorcontrib><creatorcontrib>Qiu, C.W.</creatorcontrib><title>Goos-Häanchen shift at the surface of chiral negative refractive media</title><title>2008 International Workshop on Metamaterials</title><addtitle>META</addtitle><description>The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle.</description><subject>Boundary conditions</subject><subject>Dielectrics</subject><subject>Geometrical optics</subject><subject>Optical devices</subject><subject>Optical refraction</subject><subject>Optical sensors</subject><subject>Optical surface waves</subject><subject>Optical waveguides</subject><subject>Polarization</subject><subject>Reflection</subject><isbn>9781424426089</isbn><isbn>1424426081</isbn><isbn>9781424426096</isbn><isbn>142442609X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNp9jjsOwjAYg4MQEq8eALHkAi1pEtpkRKjAwtYd_Sp_aBBtUVKQuA834WI8xMKCF_uTPZiQScyiOGZ6ts3yRcQZU5FMuZgL1SGBTlUsuZQ8YTrp_rDSPTJ8zzWTKlF9Enh_ZC_JuRBcDch63TQ-3DzuUBcl1tSX1rQUWtqWSP3FGSiQNoYWpXVwojUeoLVXpA6Ng-ITK9xbGJOegZPH4OsjMl1l-XITWkTcnZ2twN1238_if_sEfP5BNw</recordid><startdate>200811</startdate><enddate>200811</enddate><creator>Dong, W.T.</creator><creator>Gao, L.</creator><creator>Qiu, C.W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200811</creationdate><title>Goos-Häanchen shift at the surface of chiral negative refractive media</title><author>Dong, W.T. ; Gao, L. ; Qiu, C.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_47235383</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Boundary conditions</topic><topic>Dielectrics</topic><topic>Geometrical optics</topic><topic>Optical devices</topic><topic>Optical refraction</topic><topic>Optical sensors</topic><topic>Optical surface waves</topic><topic>Optical waveguides</topic><topic>Polarization</topic><topic>Reflection</topic><toplevel>online_resources</toplevel><creatorcontrib>Dong, W.T.</creatorcontrib><creatorcontrib>Gao, L.</creatorcontrib><creatorcontrib>Qiu, C.W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dong, W.T.</au><au>Gao, L.</au><au>Qiu, C.W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Goos-Häanchen shift at the surface of chiral negative refractive media</atitle><btitle>2008 International Workshop on Metamaterials</btitle><stitle>META</stitle><date>2008-11</date><risdate>2008</risdate><spage>77</spage><epage>80</epage><pages>77-80</pages><isbn>9781424426089</isbn><isbn>1424426081</isbn><eisbn>9781424426096</eisbn><eisbn>142442609X</eisbn><abstract>The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle.</abstract><pub>IEEE</pub><doi>10.1109/META.2008.4723538</doi></addata></record> |
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subjects | Boundary conditions Dielectrics Geometrical optics Optical devices Optical refraction Optical sensors Optical surface waves Optical waveguides Polarization Reflection |
title | Goos-Häanchen shift at the surface of chiral negative refractive media |
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