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Goos-Häanchen shift at the surface of chiral negative refractive media

The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive w...

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Main Authors: Dong, W.T., Gao, L., Qiu, C.W.
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Gao, L.
Qiu, C.W.
description The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle.
doi_str_mv 10.1109/META.2008.4723538
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4723538</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4723538</ieee_id><sourcerecordid>4723538</sourcerecordid><originalsourceid>FETCH-ieee_primary_47235383</originalsourceid><addsrcrecordid>eNp9jjsOwjAYg4MQEq8eALHkAi1pEtpkRKjAwtYd_Sp_aBBtUVKQuA834WI8xMKCF_uTPZiQScyiOGZ6ts3yRcQZU5FMuZgL1SGBTlUsuZQ8YTrp_rDSPTJ8zzWTKlF9Enh_ZC_JuRBcDch63TQ-3DzuUBcl1tSX1rQUWtqWSP3FGSiQNoYWpXVwojUeoLVXpA6Ng-ITK9xbGJOegZPH4OsjMl1l-XITWkTcnZ2twN1238_if_sEfP5BNw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Goos-Häanchen shift at the surface of chiral negative refractive media</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Dong, W.T. ; Gao, L. ; Qiu, C.W.</creator><creatorcontrib>Dong, W.T. ; Gao, L. ; Qiu, C.W.</creatorcontrib><description>The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle.</description><identifier>ISBN: 9781424426089</identifier><identifier>ISBN: 1424426081</identifier><identifier>EISBN: 9781424426096</identifier><identifier>EISBN: 142442609X</identifier><identifier>DOI: 10.1109/META.2008.4723538</identifier><identifier>LCCN: 2008904868</identifier><language>eng</language><publisher>IEEE</publisher><subject>Boundary conditions ; Dielectrics ; Geometrical optics ; Optical devices ; Optical refraction ; Optical sensors ; Optical surface waves ; Optical waveguides ; Polarization ; Reflection</subject><ispartof>2008 International Workshop on Metamaterials, 2008, p.77-80</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4723538$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4723538$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Dong, W.T.</creatorcontrib><creatorcontrib>Gao, L.</creatorcontrib><creatorcontrib>Qiu, C.W.</creatorcontrib><title>Goos-Häanchen shift at the surface of chiral negative refractive media</title><title>2008 International Workshop on Metamaterials</title><addtitle>META</addtitle><description>The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle.</description><subject>Boundary conditions</subject><subject>Dielectrics</subject><subject>Geometrical optics</subject><subject>Optical devices</subject><subject>Optical refraction</subject><subject>Optical sensors</subject><subject>Optical surface waves</subject><subject>Optical waveguides</subject><subject>Polarization</subject><subject>Reflection</subject><isbn>9781424426089</isbn><isbn>1424426081</isbn><isbn>9781424426096</isbn><isbn>142442609X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNp9jjsOwjAYg4MQEq8eALHkAi1pEtpkRKjAwtYd_Sp_aBBtUVKQuA834WI8xMKCF_uTPZiQScyiOGZ6ts3yRcQZU5FMuZgL1SGBTlUsuZQ8YTrp_rDSPTJ8zzWTKlF9Enh_ZC_JuRBcDch63TQ-3DzuUBcl1tSX1rQUWtqWSP3FGSiQNoYWpXVwojUeoLVXpA6Ng-ITK9xbGJOegZPH4OsjMl1l-XITWkTcnZ2twN1238_if_sEfP5BNw</recordid><startdate>200811</startdate><enddate>200811</enddate><creator>Dong, W.T.</creator><creator>Gao, L.</creator><creator>Qiu, C.W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200811</creationdate><title>Goos-Häanchen shift at the surface of chiral negative refractive media</title><author>Dong, W.T. ; Gao, L. ; Qiu, C.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_47235383</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Boundary conditions</topic><topic>Dielectrics</topic><topic>Geometrical optics</topic><topic>Optical devices</topic><topic>Optical refraction</topic><topic>Optical sensors</topic><topic>Optical surface waves</topic><topic>Optical waveguides</topic><topic>Polarization</topic><topic>Reflection</topic><toplevel>online_resources</toplevel><creatorcontrib>Dong, W.T.</creatorcontrib><creatorcontrib>Gao, L.</creatorcontrib><creatorcontrib>Qiu, C.W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dong, W.T.</au><au>Gao, L.</au><au>Qiu, C.W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Goos-Häanchen shift at the surface of chiral negative refractive media</atitle><btitle>2008 International Workshop on Metamaterials</btitle><stitle>META</stitle><date>2008-11</date><risdate>2008</risdate><spage>77</spage><epage>80</epage><pages>77-80</pages><isbn>9781424426089</isbn><isbn>1424426081</isbn><eisbn>9781424426096</eisbn><eisbn>142442609X</eisbn><abstract>The Goos-Hachen (GH) shift at the surface of chiral negative refraction media is analyzed theoretically. GH shifts are observed for both components of the reflected field near the respective critical angles. It is found that the shifts for both components of the reflected field are always positive when angles of incidence are larger than the second critical angle.</abstract><pub>IEEE</pub><doi>10.1109/META.2008.4723538</doi></addata></record>
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Boundary conditions
Dielectrics
Geometrical optics
Optical devices
Optical refraction
Optical sensors
Optical surface waves
Optical waveguides
Polarization
Reflection
title Goos-Häanchen shift at the surface of chiral negative refractive media
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T10%3A41%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Goos-H%C3%A4anchen%20shift%20at%20the%20surface%20of%20chiral%20negative%20refractive%20media&rft.btitle=2008%20International%20Workshop%20on%20Metamaterials&rft.au=Dong,%20W.T.&rft.date=2008-11&rft.spage=77&rft.epage=80&rft.pages=77-80&rft.isbn=9781424426089&rft.isbn_list=1424426081&rft_id=info:doi/10.1109/META.2008.4723538&rft.eisbn=9781424426096&rft.eisbn_list=142442609X&rft_dat=%3Cieee_6IE%3E4723538%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-ieee_primary_47235383%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4723538&rfr_iscdi=true