Sensitivity Analysis of the Simulated Annealing Method to Measurement Noise for the Inversion of Subsurface Parameters of Two Layer Rough Surfaces

We have shown that the method of simulated annealing (SA) is capable of inverting subsurface parameters of a three-dimensional, two-layer dielectric structure with slightly rough interfaces. In this work, we address the sensitivity of the Simulated Annealing to measurement noise. We also study the i...

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Bibliographic Details
Main Authors: Tabatabaeenejad, A., Moghaddam, M.
Format: Conference Proceeding
Language:English
Subjects:
Analytical models
Computational modeling
Frequency measurement
inversion
Layered rough surfaces
measurement parameters
noise
Noise measurement
Pollution measurement
Rough surfaces
sensitivity
Sensitivity analysis
Simulated annealing
subsurface parameters
Surface roughness
Surface structures
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Summary:We have shown that the method of simulated annealing (SA) is capable of inverting subsurface parameters of a three-dimensional, two-layer dielectric structure with slightly rough interfaces. In this work, we address the sensitivity of the Simulated Annealing to measurement noise. We also study the impact of the number of measurement parameters, i.e., number of frequency points and number of observation angles, on sensitivity of the inversion algorithm.
ISSN:2153-6996
2153-7003
DOI:10.1109/IGARSS.2008.4779555