Loading…
Errors of phase and group delays in SAW RFID with phase modulation
In order to obtain the exact time delay of pulses in the surface acoustic wave (SAW) based radio frequency identification (RFID) at unknown temperature, we propose a method for obtaining a high phase ambiguity resolution by measuring group delays and constructing some restriction on the exact positi...
Saved in:
Main Authors: | , , , , , , , , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 1958 |
container_issue | |
container_start_page | 1955 |
container_title | |
container_volume | |
creator | Tao Han Lin Wei Jiming Lin Weibiao Wang Haodong Wu Yongan Shui Xuesong Du Yi Ding Liang Cao Tinghui Qin |
description | In order to obtain the exact time delay of pulses in the surface acoustic wave (SAW) based radio frequency identification (RFID) at unknown temperature, we propose a method for obtaining a high phase ambiguity resolution by measuring group delays and constructing some restriction on the exact positions of reflectors. To define the restriction parameters for a SAW RFID system with large code capacity and reliable identification, it is imperative to have a priori knowledge on the errors of group delay and phase. In this paper, we present the experimental and simulation errors for both phases and group delay, originated from the design procedure, the temperature effect, the fabrication process and the measurement. The temperature range in our investigation is -5deg -45degC. The average error of phase delay is about 4deg; the maximum error of phase delay is about 16deg. The maximum error of group delay is about 10 periods. |
doi_str_mv | 10.1109/ULTSYM.2008.0482 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4803628</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4803628</ieee_id><sourcerecordid>4803628</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-7f42c559720d4a480314c45f2fc74d2903031d4bde212fd2bd9967d2463cca403</originalsourceid><addsrcrecordid>eNo9T8FKw0AUXNGCbfUueNkfSHzv5SWbHGtttRARbIt4KtvsxkbSJGRTSv_eiEUYGGYYhhkh7hB8REge1ulq-fnqE0DsA8d0IUbIxD1iwMt_QXFwJYYIIXqAqAZiqAIvYmSIrsXIuW8AgpB4KB5nbVu3Tta5bHbaWakrI7_a-tBIY0t9crKo5HLyId_niyd5LLrdObevzaHUXVFXN2KQ69LZ2zOPxXo-W01fvPTteTGdpF6BKuw8lTNlYZgoAsO63xsgZxzmlGeKDSUQ9I7hrbGElBvamiSJlCGOgizTDMFY3P_1FtbaTdMWe92eNr9FUf_3B0w1S64</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Errors of phase and group delays in SAW RFID with phase modulation</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Tao Han ; Lin Wei ; Jiming Lin ; Weibiao Wang ; Haodong Wu ; Yongan Shui ; Xuesong Du ; Yi Ding ; Liang Cao ; Tinghui Qin</creator><creatorcontrib>Tao Han ; Lin Wei ; Jiming Lin ; Weibiao Wang ; Haodong Wu ; Yongan Shui ; Xuesong Du ; Yi Ding ; Liang Cao ; Tinghui Qin</creatorcontrib><description>In order to obtain the exact time delay of pulses in the surface acoustic wave (SAW) based radio frequency identification (RFID) at unknown temperature, we propose a method for obtaining a high phase ambiguity resolution by measuring group delays and constructing some restriction on the exact positions of reflectors. To define the restriction parameters for a SAW RFID system with large code capacity and reliable identification, it is imperative to have a priori knowledge on the errors of group delay and phase. In this paper, we present the experimental and simulation errors for both phases and group delay, originated from the design procedure, the temperature effect, the fabrication process and the measurement. The temperature range in our investigation is -5deg -45degC. The average error of phase delay is about 4deg; the maximum error of phase delay is about 16deg. The maximum error of group delay is about 10 periods.</description><identifier>ISSN: 1051-0117</identifier><identifier>ISBN: 1424424283</identifier><identifier>ISBN: 9781424424283</identifier><identifier>EISBN: 1424424801</identifier><identifier>EISBN: 9781424424801</identifier><identifier>DOI: 10.1109/ULTSYM.2008.0482</identifier><identifier>LCCN: 73-641406</identifier><language>eng</language><publisher>IEEE</publisher><subject>Acoustic measurements ; Acoustic pulses ; Acoustic waves ; Delay effects ; group delay error ; phase error ; Phase measurement ; Phase modulation ; Pulse measurements ; radio frequency identification ; Radiofrequency identification ; surface acoustic wave ; Surface acoustic waves ; Temperature</subject><ispartof>2008 IEEE Ultrasonics Symposium, 2008, p.1955-1958</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4803628$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4803628$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Tao Han</creatorcontrib><creatorcontrib>Lin Wei</creatorcontrib><creatorcontrib>Jiming Lin</creatorcontrib><creatorcontrib>Weibiao Wang</creatorcontrib><creatorcontrib>Haodong Wu</creatorcontrib><creatorcontrib>Yongan Shui</creatorcontrib><creatorcontrib>Xuesong Du</creatorcontrib><creatorcontrib>Yi Ding</creatorcontrib><creatorcontrib>Liang Cao</creatorcontrib><creatorcontrib>Tinghui Qin</creatorcontrib><title>Errors of phase and group delays in SAW RFID with phase modulation</title><title>2008 IEEE Ultrasonics Symposium</title><addtitle>ULTSYM</addtitle><description>In order to obtain the exact time delay of pulses in the surface acoustic wave (SAW) based radio frequency identification (RFID) at unknown temperature, we propose a method for obtaining a high phase ambiguity resolution by measuring group delays and constructing some restriction on the exact positions of reflectors. To define the restriction parameters for a SAW RFID system with large code capacity and reliable identification, it is imperative to have a priori knowledge on the errors of group delay and phase. In this paper, we present the experimental and simulation errors for both phases and group delay, originated from the design procedure, the temperature effect, the fabrication process and the measurement. The temperature range in our investigation is -5deg -45degC. The average error of phase delay is about 4deg; the maximum error of phase delay is about 16deg. The maximum error of group delay is about 10 periods.</description><subject>Acoustic measurements</subject><subject>Acoustic pulses</subject><subject>Acoustic waves</subject><subject>Delay effects</subject><subject>group delay error</subject><subject>phase error</subject><subject>Phase measurement</subject><subject>Phase modulation</subject><subject>Pulse measurements</subject><subject>radio frequency identification</subject><subject>Radiofrequency identification</subject><subject>surface acoustic wave</subject><subject>Surface acoustic waves</subject><subject>Temperature</subject><issn>1051-0117</issn><isbn>1424424283</isbn><isbn>9781424424283</isbn><isbn>1424424801</isbn><isbn>9781424424801</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo9T8FKw0AUXNGCbfUueNkfSHzv5SWbHGtttRARbIt4KtvsxkbSJGRTSv_eiEUYGGYYhhkh7hB8REge1ulq-fnqE0DsA8d0IUbIxD1iwMt_QXFwJYYIIXqAqAZiqAIvYmSIrsXIuW8AgpB4KB5nbVu3Tta5bHbaWakrI7_a-tBIY0t9crKo5HLyId_niyd5LLrdObevzaHUXVFXN2KQ69LZ2zOPxXo-W01fvPTteTGdpF6BKuw8lTNlYZgoAsO63xsgZxzmlGeKDSUQ9I7hrbGElBvamiSJlCGOgizTDMFY3P_1FtbaTdMWe92eNr9FUf_3B0w1S64</recordid><startdate>200811</startdate><enddate>200811</enddate><creator>Tao Han</creator><creator>Lin Wei</creator><creator>Jiming Lin</creator><creator>Weibiao Wang</creator><creator>Haodong Wu</creator><creator>Yongan Shui</creator><creator>Xuesong Du</creator><creator>Yi Ding</creator><creator>Liang Cao</creator><creator>Tinghui Qin</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200811</creationdate><title>Errors of phase and group delays in SAW RFID with phase modulation</title><author>Tao Han ; Lin Wei ; Jiming Lin ; Weibiao Wang ; Haodong Wu ; Yongan Shui ; Xuesong Du ; Yi Ding ; Liang Cao ; Tinghui Qin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-7f42c559720d4a480314c45f2fc74d2903031d4bde212fd2bd9967d2463cca403</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Acoustic measurements</topic><topic>Acoustic pulses</topic><topic>Acoustic waves</topic><topic>Delay effects</topic><topic>group delay error</topic><topic>phase error</topic><topic>Phase measurement</topic><topic>Phase modulation</topic><topic>Pulse measurements</topic><topic>radio frequency identification</topic><topic>Radiofrequency identification</topic><topic>surface acoustic wave</topic><topic>Surface acoustic waves</topic><topic>Temperature</topic><toplevel>online_resources</toplevel><creatorcontrib>Tao Han</creatorcontrib><creatorcontrib>Lin Wei</creatorcontrib><creatorcontrib>Jiming Lin</creatorcontrib><creatorcontrib>Weibiao Wang</creatorcontrib><creatorcontrib>Haodong Wu</creatorcontrib><creatorcontrib>Yongan Shui</creatorcontrib><creatorcontrib>Xuesong Du</creatorcontrib><creatorcontrib>Yi Ding</creatorcontrib><creatorcontrib>Liang Cao</creatorcontrib><creatorcontrib>Tinghui Qin</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tao Han</au><au>Lin Wei</au><au>Jiming Lin</au><au>Weibiao Wang</au><au>Haodong Wu</au><au>Yongan Shui</au><au>Xuesong Du</au><au>Yi Ding</au><au>Liang Cao</au><au>Tinghui Qin</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Errors of phase and group delays in SAW RFID with phase modulation</atitle><btitle>2008 IEEE Ultrasonics Symposium</btitle><stitle>ULTSYM</stitle><date>2008-11</date><risdate>2008</risdate><spage>1955</spage><epage>1958</epage><pages>1955-1958</pages><issn>1051-0117</issn><isbn>1424424283</isbn><isbn>9781424424283</isbn><eisbn>1424424801</eisbn><eisbn>9781424424801</eisbn><abstract>In order to obtain the exact time delay of pulses in the surface acoustic wave (SAW) based radio frequency identification (RFID) at unknown temperature, we propose a method for obtaining a high phase ambiguity resolution by measuring group delays and constructing some restriction on the exact positions of reflectors. To define the restriction parameters for a SAW RFID system with large code capacity and reliable identification, it is imperative to have a priori knowledge on the errors of group delay and phase. In this paper, we present the experimental and simulation errors for both phases and group delay, originated from the design procedure, the temperature effect, the fabrication process and the measurement. The temperature range in our investigation is -5deg -45degC. The average error of phase delay is about 4deg; the maximum error of phase delay is about 16deg. The maximum error of group delay is about 10 periods.</abstract><pub>IEEE</pub><doi>10.1109/ULTSYM.2008.0482</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1051-0117 |
ispartof | 2008 IEEE Ultrasonics Symposium, 2008, p.1955-1958 |
issn | 1051-0117 |
language | eng |
recordid | cdi_ieee_primary_4803628 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Acoustic measurements Acoustic pulses Acoustic waves Delay effects group delay error phase error Phase measurement Phase modulation Pulse measurements radio frequency identification Radiofrequency identification surface acoustic wave Surface acoustic waves Temperature |
title | Errors of phase and group delays in SAW RFID with phase modulation |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T01%3A14%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Errors%20of%20phase%20and%20group%20delays%20in%20SAW%20RFID%20with%20phase%20modulation&rft.btitle=2008%20IEEE%20Ultrasonics%20Symposium&rft.au=Tao%20Han&rft.date=2008-11&rft.spage=1955&rft.epage=1958&rft.pages=1955-1958&rft.issn=1051-0117&rft.isbn=1424424283&rft.isbn_list=9781424424283&rft_id=info:doi/10.1109/ULTSYM.2008.0482&rft.eisbn=1424424801&rft.eisbn_list=9781424424801&rft_dat=%3Cieee_6IE%3E4803628%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-7f42c559720d4a480314c45f2fc74d2903031d4bde212fd2bd9967d2463cca403%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4803628&rfr_iscdi=true |