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Design and Characteristics of Guardring-Free Planar AlInAs Avalanche Photodiodes
This paper reports a guardring-free planar AlInAs avalanche photodiode (APD) for optical fiber communications. AlInAs APDs can achieve a larger gain-bandwidth product (GBP) with lower excess noise than commercial InP APDs, and the guardring-free planar structure enables these superior AlInAs APDs to...
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Published in: | Journal of lightwave technology 2009-04, Vol.27 (8), p.1011-1017 |
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container_title | Journal of lightwave technology |
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description | This paper reports a guardring-free planar AlInAs avalanche photodiode (APD) for optical fiber communications. AlInAs APDs can achieve a larger gain-bandwidth product (GBP) with lower excess noise than commercial InP APDs, and the guardring-free planar structure enables these superior AlInAs APDs to have both a low dark current and high reliability for practical use. We present the structure, fabrication, designs, APD characteristics, and receiver sensitivity, systematically. The guardring-free planar structure and its peculiarities are described, and we show APD designs for 2.5-Gb/s and 10-Gb/s applications and their characteristics. A 0.2-mum -thick AlInAs multiplication layer achieves a GBP of 120 GHz and an excess noise factor of 2.9 at a multiplication factor of 10. Their dark currents are less than 20 nA and their lifetime is evaluated to be 25 million hours at 85 deg C. Lastly, we demonstrate that the guardring-free planar AlInAs APDs with a transimpedance amplifier achieve the remarkable sensitivity of -37.0 dBm at a bit error rate of 10 -10 for 2.5-Gb/s signals and of -29.9 dBm at a bit error rate of 10 -12 for 10-Gb/s signals. This performance indicates that the guardring-free planar AlInAs APDs have made great advances against commercial InP APDs and other AlInAs APDs. |
doi_str_mv | 10.1109/JLT.2008.2004954 |
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AlInAs APDs can achieve a larger gain-bandwidth product (GBP) with lower excess noise than commercial InP APDs, and the guardring-free planar structure enables these superior AlInAs APDs to have both a low dark current and high reliability for practical use. We present the structure, fabrication, designs, APD characteristics, and receiver sensitivity, systematically. The guardring-free planar structure and its peculiarities are described, and we show APD designs for 2.5-Gb/s and 10-Gb/s applications and their characteristics. A 0.2-mum -thick AlInAs multiplication layer achieves a GBP of 120 GHz and an excess noise factor of 2.9 at a multiplication factor of 10. Their dark currents are less than 20 nA and their lifetime is evaluated to be 25 million hours at 85 deg C. Lastly, we demonstrate that the guardring-free planar AlInAs APDs with a transimpedance amplifier achieve the remarkable sensitivity of -37.0 dBm at a bit error rate of 10 -10 for 2.5-Gb/s signals and of -29.9 dBm at a bit error rate of 10 -12 for 10-Gb/s signals. This performance indicates that the guardring-free planar AlInAs APDs have made great advances against commercial InP APDs and other AlInAs APDs.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2008.2004954</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Avalanche photodiodes ; Avalanche photodiodes (APDs) ; Avalanches ; Bit error rate ; Bit rate ; Charge carrier processes ; Circuit properties ; Dark current ; Design engineering ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Indium phosphide ; Indium phosphides ; Integrated optics. Optical fibers and wave guides ; Ionization ; Multiplication ; Optical and optoelectronic circuits ; Optical fiber communication ; Optical fiber communications ; Optical noise ; Optical receivers ; Optical telecommunications ; Optoelectronic devices ; Photodiodes ; Planar structures ; reliability ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; sensitivity ; Studies ; Systems, networks and services of telecommunications ; Telecommunications ; Telecommunications and information theory ; Transmission and modulation (techniques and equipments)</subject><ispartof>Journal of lightwave technology, 2009-04, Vol.27 (8), p.1011-1017</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c482t-bf3c4e0d9429b6f81555d5c4529bffa881279ceaf3db14505c56af712081cacc3</citedby><cites>FETCH-LOGICAL-c482t-bf3c4e0d9429b6f81555d5c4529bffa881279ceaf3db14505c56af712081cacc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4814736$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21402898$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Yagyu, E.</creatorcontrib><creatorcontrib>Ishimura, E.</creatorcontrib><creatorcontrib>Nakaji, M.</creatorcontrib><creatorcontrib>Ihara, S.</creatorcontrib><creatorcontrib>Mikami, Y.</creatorcontrib><creatorcontrib>Itamoto, H.</creatorcontrib><creatorcontrib>Aoyagi, T.</creatorcontrib><creatorcontrib>Yoshiara, K.</creatorcontrib><creatorcontrib>Tokuda, Y.</creatorcontrib><title>Design and Characteristics of Guardring-Free Planar AlInAs Avalanche Photodiodes</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>This paper reports a guardring-free planar AlInAs avalanche photodiode (APD) for optical fiber communications. AlInAs APDs can achieve a larger gain-bandwidth product (GBP) with lower excess noise than commercial InP APDs, and the guardring-free planar structure enables these superior AlInAs APDs to have both a low dark current and high reliability for practical use. We present the structure, fabrication, designs, APD characteristics, and receiver sensitivity, systematically. The guardring-free planar structure and its peculiarities are described, and we show APD designs for 2.5-Gb/s and 10-Gb/s applications and their characteristics. A 0.2-mum -thick AlInAs multiplication layer achieves a GBP of 120 GHz and an excess noise factor of 2.9 at a multiplication factor of 10. Their dark currents are less than 20 nA and their lifetime is evaluated to be 25 million hours at 85 deg C. Lastly, we demonstrate that the guardring-free planar AlInAs APDs with a transimpedance amplifier achieve the remarkable sensitivity of -37.0 dBm at a bit error rate of 10 -10 for 2.5-Gb/s signals and of -29.9 dBm at a bit error rate of 10 -12 for 10-Gb/s signals. This performance indicates that the guardring-free planar AlInAs APDs have made great advances against commercial InP APDs and other AlInAs APDs.</description><subject>Applied sciences</subject><subject>Avalanche photodiodes</subject><subject>Avalanche photodiodes (APDs)</subject><subject>Avalanches</subject><subject>Bit error rate</subject><subject>Bit rate</subject><subject>Charge carrier processes</subject><subject>Circuit properties</subject><subject>Dark current</subject><subject>Design engineering</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Indium phosphide</subject><subject>Indium phosphides</subject><subject>Integrated optics. Optical fibers and wave guides</subject><subject>Ionization</subject><subject>Multiplication</subject><subject>Optical and optoelectronic circuits</subject><subject>Optical fiber communication</subject><subject>Optical fiber communications</subject><subject>Optical noise</subject><subject>Optical receivers</subject><subject>Optical telecommunications</subject><subject>Optoelectronic devices</subject><subject>Photodiodes</subject><subject>Planar structures</subject><subject>reliability</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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Optical fibers and wave guides</topic><topic>Ionization</topic><topic>Multiplication</topic><topic>Optical and optoelectronic circuits</topic><topic>Optical fiber communication</topic><topic>Optical fiber communications</topic><topic>Optical noise</topic><topic>Optical receivers</topic><topic>Optical telecommunications</topic><topic>Optoelectronic devices</topic><topic>Photodiodes</topic><topic>Planar structures</topic><topic>reliability</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>sensitivity</topic><topic>Studies</topic><topic>Systems, networks and services of telecommunications</topic><topic>Telecommunications</topic><topic>Telecommunications and information theory</topic><topic>Transmission and modulation (techniques and equipments)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yagyu, E.</creatorcontrib><creatorcontrib>Ishimura, E.</creatorcontrib><creatorcontrib>Nakaji, M.</creatorcontrib><creatorcontrib>Ihara, S.</creatorcontrib><creatorcontrib>Mikami, Y.</creatorcontrib><creatorcontrib>Itamoto, H.</creatorcontrib><creatorcontrib>Aoyagi, T.</creatorcontrib><creatorcontrib>Yoshiara, K.</creatorcontrib><creatorcontrib>Tokuda, Y.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Xplore</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yagyu, E.</au><au>Ishimura, E.</au><au>Nakaji, M.</au><au>Ihara, S.</au><au>Mikami, Y.</au><au>Itamoto, H.</au><au>Aoyagi, T.</au><au>Yoshiara, K.</au><au>Tokuda, Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Design and Characteristics of Guardring-Free Planar AlInAs Avalanche Photodiodes</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>2009-04-15</date><risdate>2009</risdate><volume>27</volume><issue>8</issue><spage>1011</spage><epage>1017</epage><pages>1011-1017</pages><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>This paper reports a guardring-free planar AlInAs avalanche photodiode (APD) for optical fiber communications. AlInAs APDs can achieve a larger gain-bandwidth product (GBP) with lower excess noise than commercial InP APDs, and the guardring-free planar structure enables these superior AlInAs APDs to have both a low dark current and high reliability for practical use. We present the structure, fabrication, designs, APD characteristics, and receiver sensitivity, systematically. The guardring-free planar structure and its peculiarities are described, and we show APD designs for 2.5-Gb/s and 10-Gb/s applications and their characteristics. A 0.2-mum -thick AlInAs multiplication layer achieves a GBP of 120 GHz and an excess noise factor of 2.9 at a multiplication factor of 10. Their dark currents are less than 20 nA and their lifetime is evaluated to be 25 million hours at 85 deg C. Lastly, we demonstrate that the guardring-free planar AlInAs APDs with a transimpedance amplifier achieve the remarkable sensitivity of -37.0 dBm at a bit error rate of 10 -10 for 2.5-Gb/s signals and of -29.9 dBm at a bit error rate of 10 -12 for 10-Gb/s signals. This performance indicates that the guardring-free planar AlInAs APDs have made great advances against commercial InP APDs and other AlInAs APDs.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/JLT.2008.2004954</doi><tpages>7</tpages></addata></record> |
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subjects | Applied sciences Avalanche photodiodes Avalanche photodiodes (APDs) Avalanches Bit error rate Bit rate Charge carrier processes Circuit properties Dark current Design engineering Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Indium phosphide Indium phosphides Integrated optics. Optical fibers and wave guides Ionization Multiplication Optical and optoelectronic circuits Optical fiber communication Optical fiber communications Optical noise Optical receivers Optical telecommunications Optoelectronic devices Photodiodes Planar structures reliability Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices sensitivity Studies Systems, networks and services of telecommunications Telecommunications Telecommunications and information theory Transmission and modulation (techniques and equipments) |
title | Design and Characteristics of Guardring-Free Planar AlInAs Avalanche Photodiodes |
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