A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

A degradation monitor that allows the prediction of the light output degradation of light emitting diodes is described. This is based on the variation of the differential cathodoluminescence signal output to distinguish between "good" and "bad" devices. A corresponding method usi...

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Bibliographic Details
Main Authors: Wittpahl, V., Liu, Y.Y., Chan, D.S.H., Chim, W.K., Phang, J.C.H., Balk, L.J., Yan, K.P.
Format: Conference Proceeding
Language:English
Subjects:
Condition monitoring
Degradation
Failure analysis
Light emitting diodes
Optical fiber communication
Optoelectronic devices
Radiative recombination
Scanning electron microscopy
Semiconductor devices
Spontaneous emission
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Description
Summary:A degradation monitor that allows the prediction of the light output degradation of light emitting diodes is described. This is based on the variation of the differential cathodoluminescence signal output to distinguish between "good" and "bad" devices. A corresponding method using the variation of the junction ideality factor during stressing is also described.
DOI:10.1109/RELPHY.1996.492080