Loading…
Calculating BPEL test coverage through instrumentation
Assessing the quality of tests for BPEL processes is a difficult task in projects following SOA principles. Since insufficient testing can lead to unforeseen defects that can be extremely costly in complex and mission critical environments, this problem needs to be addressed. By using formally defin...
Saved in:
Main Authors: | , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 122 |
container_issue | |
container_start_page | 115 |
container_title | |
container_volume | |
creator | Lubke, D. Singer, L. Salnikow, A. |
description | Assessing the quality of tests for BPEL processes is a difficult task in projects following SOA principles. Since insufficient testing can lead to unforeseen defects that can be extremely costly in complex and mission critical environments, this problem needs to be addressed. By using formally defined test metrics that can be evaluated automatically by using an extension to the BPELUnit testing framework, testers are able to assess whether their white box tests cover all important areas of a BPEL process. This leads to better tests and thus to better BPEL processes because testers can improve their test cases by knowing which important areas of the BPEL process have not been tested yet. |
doi_str_mv | 10.1109/IWAST.2009.5069049 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5069049</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5069049</ieee_id><sourcerecordid>5069049</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-f79bd3b9623f0a7609cceb51c0a1219782408da2b9e2bbc952610eefc3a3c8f43</originalsourceid><addsrcrecordid>eNotj8FKw0AURQekoK39Ad3kBxLfm5lM8pY1VC0EFKy4LDPTlzSSJpJMBP_egL2buziXA1eIO4QEEehh97l53ycSgJIUDIGmK7FELbVWGaJaiOXMckKkPLsW63H8gjk6VdrIG2EK2_qptaHp6ujxbVtGgccQ-f6HB1tzFE5DP9WnqOnGMExn7sI87btbsahsO_L60ivx8bTdFy9x-fq8KzZl3GCWhrjKyB2VIyNVBTYzQN6zS9GDRYmU5VJDfrTSEUvnPKXSIDBXXlnl80qrlbj_9zbMfPgemrMdfg-Xn-oPRtpG-A</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Calculating BPEL test coverage through instrumentation</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Lubke, D. ; Singer, L. ; Salnikow, A.</creator><creatorcontrib>Lubke, D. ; Singer, L. ; Salnikow, A.</creatorcontrib><description>Assessing the quality of tests for BPEL processes is a difficult task in projects following SOA principles. Since insufficient testing can lead to unforeseen defects that can be extremely costly in complex and mission critical environments, this problem needs to be addressed. By using formally defined test metrics that can be evaluated automatically by using an extension to the BPELUnit testing framework, testers are able to assess whether their white box tests cover all important areas of a BPEL process. This leads to better tests and thus to better BPEL processes because testers can improve their test cases by knowing which important areas of the BPEL process have not been tested yet.</description><identifier>ISBN: 1424437113</identifier><identifier>ISBN: 9781424437115</identifier><identifier>DOI: 10.1109/IWAST.2009.5069049</identifier><identifier>LCCN: 2008911987</identifier><language>eng</language><publisher>IEEE</publisher><subject>Area measurement ; Automatic testing ; Instruments ; Mission critical systems ; Semiconductor optical amplifiers ; Service oriented architecture ; Software engineering ; Software testing ; System testing ; Web services</subject><ispartof>2009 ICSE Workshop on Automation of Software Test, 2009, p.115-122</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5069049$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5069049$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lubke, D.</creatorcontrib><creatorcontrib>Singer, L.</creatorcontrib><creatorcontrib>Salnikow, A.</creatorcontrib><title>Calculating BPEL test coverage through instrumentation</title><title>2009 ICSE Workshop on Automation of Software Test</title><addtitle>IWAST</addtitle><description>Assessing the quality of tests for BPEL processes is a difficult task in projects following SOA principles. Since insufficient testing can lead to unforeseen defects that can be extremely costly in complex and mission critical environments, this problem needs to be addressed. By using formally defined test metrics that can be evaluated automatically by using an extension to the BPELUnit testing framework, testers are able to assess whether their white box tests cover all important areas of a BPEL process. This leads to better tests and thus to better BPEL processes because testers can improve their test cases by knowing which important areas of the BPEL process have not been tested yet.</description><subject>Area measurement</subject><subject>Automatic testing</subject><subject>Instruments</subject><subject>Mission critical systems</subject><subject>Semiconductor optical amplifiers</subject><subject>Service oriented architecture</subject><subject>Software engineering</subject><subject>Software testing</subject><subject>System testing</subject><subject>Web services</subject><isbn>1424437113</isbn><isbn>9781424437115</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj8FKw0AURQekoK39Ad3kBxLfm5lM8pY1VC0EFKy4LDPTlzSSJpJMBP_egL2buziXA1eIO4QEEehh97l53ycSgJIUDIGmK7FELbVWGaJaiOXMckKkPLsW63H8gjk6VdrIG2EK2_qptaHp6ujxbVtGgccQ-f6HB1tzFE5DP9WnqOnGMExn7sI87btbsahsO_L60ivx8bTdFy9x-fq8KzZl3GCWhrjKyB2VIyNVBTYzQN6zS9GDRYmU5VJDfrTSEUvnPKXSIDBXXlnl80qrlbj_9zbMfPgemrMdfg-Xn-oPRtpG-A</recordid><startdate>200905</startdate><enddate>200905</enddate><creator>Lubke, D.</creator><creator>Singer, L.</creator><creator>Salnikow, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200905</creationdate><title>Calculating BPEL test coverage through instrumentation</title><author>Lubke, D. ; Singer, L. ; Salnikow, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-f79bd3b9623f0a7609cceb51c0a1219782408da2b9e2bbc952610eefc3a3c8f43</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Area measurement</topic><topic>Automatic testing</topic><topic>Instruments</topic><topic>Mission critical systems</topic><topic>Semiconductor optical amplifiers</topic><topic>Service oriented architecture</topic><topic>Software engineering</topic><topic>Software testing</topic><topic>System testing</topic><topic>Web services</topic><toplevel>online_resources</toplevel><creatorcontrib>Lubke, D.</creatorcontrib><creatorcontrib>Singer, L.</creatorcontrib><creatorcontrib>Salnikow, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lubke, D.</au><au>Singer, L.</au><au>Salnikow, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Calculating BPEL test coverage through instrumentation</atitle><btitle>2009 ICSE Workshop on Automation of Software Test</btitle><stitle>IWAST</stitle><date>2009-05</date><risdate>2009</risdate><spage>115</spage><epage>122</epage><pages>115-122</pages><isbn>1424437113</isbn><isbn>9781424437115</isbn><abstract>Assessing the quality of tests for BPEL processes is a difficult task in projects following SOA principles. Since insufficient testing can lead to unforeseen defects that can be extremely costly in complex and mission critical environments, this problem needs to be addressed. By using formally defined test metrics that can be evaluated automatically by using an extension to the BPELUnit testing framework, testers are able to assess whether their white box tests cover all important areas of a BPEL process. This leads to better tests and thus to better BPEL processes because testers can improve their test cases by knowing which important areas of the BPEL process have not been tested yet.</abstract><pub>IEEE</pub><doi>10.1109/IWAST.2009.5069049</doi><tpages>8</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISBN: 1424437113 |
ispartof | 2009 ICSE Workshop on Automation of Software Test, 2009, p.115-122 |
issn | |
language | eng |
recordid | cdi_ieee_primary_5069049 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Area measurement Automatic testing Instruments Mission critical systems Semiconductor optical amplifiers Service oriented architecture Software engineering Software testing System testing Web services |
title | Calculating BPEL test coverage through instrumentation |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T16%3A37%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Calculating%20BPEL%20test%20coverage%20through%20instrumentation&rft.btitle=2009%20ICSE%20Workshop%20on%20Automation%20of%20Software%20Test&rft.au=Lubke,%20D.&rft.date=2009-05&rft.spage=115&rft.epage=122&rft.pages=115-122&rft.isbn=1424437113&rft.isbn_list=9781424437115&rft_id=info:doi/10.1109/IWAST.2009.5069049&rft_dat=%3Cieee_6IE%3E5069049%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-f79bd3b9623f0a7609cceb51c0a1219782408da2b9e2bbc952610eefc3a3c8f43%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5069049&rfr_iscdi=true |