Contactless testing: Possibility or pipe-dream?

The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circuits and printed circuit boards) still requires physical electrical contact through probe needles and/or sockets. This pape...

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Bibliographic Details
Main Authors: Marinissen, E.J., Dae Young Lee, Hayes, J.P., Sellathamby, C., Moore, B., Slupsky, S., Pujol, L.
Format: Conference Proceeding
Language:English
Subjects:
Circuit testing
Contacts
Electronic equipment testing
Integrated circuit testing
Needles
Pins
Printed circuits
Probes
Sockets
System testing
Online Access:Request full text
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Summary:The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circuits and printed circuit boards) still requires physical electrical contact through probe needles and/or sockets. This paper addresses the state-of-the-art, options, and hurdles-still-to-take of contactless testing, which would resolve many test challenges due to shrinking size and pitch of pads and pins and inaccessibility of advanced assembly techniques as System-in-Package (SiP) and 3D stacked ICs.
ISSN:1530-1591
1558-1101
DOI:10.1109/DATE.2009.5090751