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Applications of a generalized Dirichlet principle to transistor modeling

We report the theory, implementation and results of using a Poisson solver to compensate the measured valuer of drain conductance and transconductance in a nonlinear MESFET so as to render them compatible with a large-signal model. The consequent restructuring of the I-V curves is exhibited.

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Main Authors: Winson, P., Snider, A.D.
Format: Conference Proceeding
Language:English
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Snider, A.D.
description We report the theory, implementation and results of using a Poisson solver to compensate the measured valuer of drain conductance and transconductance in a nonlinear MESFET so as to render them compatible with a large-signal model. The consequent restructuring of the I-V curves is exhibited.
doi_str_mv 10.1109/SECON.1996.510104
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_510104</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>510104</ieee_id><sourcerecordid>510104</sourcerecordid><originalsourceid>FETCH-ieee_primary_5101043</originalsourceid><addsrcrecordid>eNp9jrEKwjAURQMiKNoP0Ck_YE1oa5tRaqWTDrqX0L7WJ2kSkiz69RZ09nLhDJcDl5ANZzHnTOxvVXm9xFyIQ5xxxlk6I5HICzY1SVhR5AsSef9kU9I0S_J0SeqjtQpbGdBoT01PJR1Ag5MK39DREzpsHwoCtQ51i1YBDYYGJ7VHH4yjo-lAoR7WZN5L5SH6cUW25-pe1jsEgGayR-lezfdW8nf8ABwePKE</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Applications of a generalized Dirichlet principle to transistor modeling</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Winson, P. ; Snider, A.D.</creator><creatorcontrib>Winson, P. ; Snider, A.D.</creatorcontrib><description>We report the theory, implementation and results of using a Poisson solver to compensate the measured valuer of drain conductance and transconductance in a nonlinear MESFET so as to render them compatible with a large-signal model. The consequent restructuring of the I-V curves is exhibited.</description><identifier>ISBN: 9780780330887</identifier><identifier>ISBN: 0780330889</identifier><identifier>DOI: 10.1109/SECON.1996.510104</identifier><language>eng</language><publisher>IEEE</publisher><subject>Boundary conditions ; Data mining ; Electric variables measurement ; Integral equations ; Mathematical model ; MESFETs ; Poisson equations ; Scattering parameters ; Transconductance ; Voltage</subject><ispartof>Proceedings of SOUTHEASTCON '96, 1996, p.425-427</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/510104$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/510104$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Winson, P.</creatorcontrib><creatorcontrib>Snider, A.D.</creatorcontrib><title>Applications of a generalized Dirichlet principle to transistor modeling</title><title>Proceedings of SOUTHEASTCON '96</title><addtitle>SECON</addtitle><description>We report the theory, implementation and results of using a Poisson solver to compensate the measured valuer of drain conductance and transconductance in a nonlinear MESFET so as to render them compatible with a large-signal model. The consequent restructuring of the I-V curves is exhibited.</description><subject>Boundary conditions</subject><subject>Data mining</subject><subject>Electric variables measurement</subject><subject>Integral equations</subject><subject>Mathematical model</subject><subject>MESFETs</subject><subject>Poisson equations</subject><subject>Scattering parameters</subject><subject>Transconductance</subject><subject>Voltage</subject><isbn>9780780330887</isbn><isbn>0780330889</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1996</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNp9jrEKwjAURQMiKNoP0Ck_YE1oa5tRaqWTDrqX0L7WJ2kSkiz69RZ09nLhDJcDl5ANZzHnTOxvVXm9xFyIQ5xxxlk6I5HICzY1SVhR5AsSef9kU9I0S_J0SeqjtQpbGdBoT01PJR1Ag5MK39DREzpsHwoCtQ51i1YBDYYGJ7VHH4yjo-lAoR7WZN5L5SH6cUW25-pe1jsEgGayR-lezfdW8nf8ABwePKE</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Winson, P.</creator><creator>Snider, A.D.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1996</creationdate><title>Applications of a generalized Dirichlet principle to transistor modeling</title><author>Winson, P. ; Snider, A.D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_5101043</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Boundary conditions</topic><topic>Data mining</topic><topic>Electric variables measurement</topic><topic>Integral equations</topic><topic>Mathematical model</topic><topic>MESFETs</topic><topic>Poisson equations</topic><topic>Scattering parameters</topic><topic>Transconductance</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Winson, P.</creatorcontrib><creatorcontrib>Snider, A.D.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Winson, P.</au><au>Snider, A.D.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Applications of a generalized Dirichlet principle to transistor modeling</atitle><btitle>Proceedings of SOUTHEASTCON '96</btitle><stitle>SECON</stitle><date>1996</date><risdate>1996</risdate><spage>425</spage><epage>427</epage><pages>425-427</pages><isbn>9780780330887</isbn><isbn>0780330889</isbn><abstract>We report the theory, implementation and results of using a Poisson solver to compensate the measured valuer of drain conductance and transconductance in a nonlinear MESFET so as to render them compatible with a large-signal model. The consequent restructuring of the I-V curves is exhibited.</abstract><pub>IEEE</pub><doi>10.1109/SECON.1996.510104</doi></addata></record>
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identifier ISBN: 9780780330887
ispartof Proceedings of SOUTHEASTCON '96, 1996, p.425-427
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language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Boundary conditions
Data mining
Electric variables measurement
Integral equations
Mathematical model
MESFETs
Poisson equations
Scattering parameters
Transconductance
Voltage
title Applications of a generalized Dirichlet principle to transistor modeling
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T19%3A46%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Applications%20of%20a%20generalized%20Dirichlet%20principle%20to%20transistor%20modeling&rft.btitle=Proceedings%20of%20SOUTHEASTCON%20'96&rft.au=Winson,%20P.&rft.date=1996&rft.spage=425&rft.epage=427&rft.pages=425-427&rft.isbn=9780780330887&rft.isbn_list=0780330889&rft_id=info:doi/10.1109/SECON.1996.510104&rft_dat=%3Cieee_6IE%3E510104%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-ieee_primary_5101043%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=510104&rfr_iscdi=true