Vector corrected on-wafer power measurements of frequency converting two-ports

In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of...

Full description

Saved in:
Bibliographic Details
Main Authors: Roth, B., Kother, D., Sporkmann, T., Lutke, W., Wolff, I.
Format: Conference Proceeding
Language:English
Subjects:
Circuits
Frequency conversion
Frequency measurement
Instruments
Power measurement
Power system harmonics
Scattering parameters
Spectral analysis
Synthesizers
Testing
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of all power waves at all ports of the DUT. Since measurements are carried out at all interesting harmonics, the system is ideal for the complete electrical characterization of a frequency multiplier for instance. In contrast to other power and harmonic measurement approaches using VNAs, the technique proposed here does not need an additional microwave synthesizer for locking the receiver to the harmonics. The described system exhibits a power sweep range of more than 80 dB.
ISSN:0149-645X
2576-7216
DOI:10.1109/MWSYM.1996.512170