Accurate product lifetime predictions based on device-level measurements

Product level lifetime margins, determined by HCI and BTI, are shrinking with scaling. We developed highly accurate device-level HCI degradation models that, together with known BTI models, are able to accurately predict frequency degradation of a ring oscillator. We show that despite substantial re...

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Bibliographic Details
Main Authors: Nigam, T., Parameshwaran, B., Krause, G.
Format: Conference Proceeding
Language:English
Subjects:
Degradation
Frequency
HCI
Human computer interaction
Niobium compounds
Predictive models
product degradation
Ring oscillators
Stress
Switching circuits
Titanium compounds
Voltage
Online Access:Request full text
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Summary:Product level lifetime margins, determined by HCI and BTI, are shrinking with scaling. We developed highly accurate device-level HCI degradation models that, together with known BTI models, are able to accurately predict frequency degradation of a ring oscillator. We show that despite substantial relief from HCI damage in balanced switching circuits, HCI degradation still accounts for 40-50% of frequency degradation for a 10-year product life.
ISSN:1541-7026
1938-1891
DOI:10.1109/IRPS.2009.5173322