Failure analysis results systematization

• Main Authors: Nagynemedi, C., Harkai, E., Rigler, D., Kovacs, R., Balogh, B., Gordon, P.
• Format: Conference Proceeding
• Language: English
• Subjects: Assembly; Atom optics; Failure analysis; Image analysis; Image databases; Information analysis; Inspection; Optical devices; Optical microscopy; Soldering
• ISSN: 2161-2528
• DOI: 10.1109/ISSE.2009.5207016

At the Department of Electronics Technology high amount of failure analysis inspections have been carried out during the last five years, thus an outstanding number of results and reports have been accumulated by the Failure Analysis Group. The results and experiences gained in the past by these analyses can provide useful information in the present and future in further cases which show similarities to former problems. Such knowledge can only be exploited if the analysis results are organized in a suitable structure and the researchers do not have to rely on their own memory. A suitable system should handle queries based on various approaches i.e. type of failure, involved component, during which process the failure occurred, applied analysis method, etc. So the analysis result storage system has to provide a possibility to find any earlier analysis result which can be in connection with current cases to provide us the previously gained experiences and conclusions. In case a lecturer wants to illustrate a presentation with images of a certain failure type or of a given analysis method then the time needed to find the right pictures can be significantly reduced by the help of the analysis database.