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Research on electrostatic between metallic particle and semiconductor matrixes

By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between...

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Main Author: Gefei Yu
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Language:English
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description By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs 2 O of previous research. Ag-Cs 2 O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.
doi_str_mv 10.1109/ICEMI.2009.5274837
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Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs 2 O of previous research. Ag-Cs 2 O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.</description><identifier>ISBN: 1424438632</identifier><identifier>ISBN: 9781424438631</identifier><identifier>EISBN: 1424438640</identifier><identifier>EISBN: 9781424438648</identifier><identifier>DOI: 10.1109/ICEMI.2009.5274837</identifier><identifier>LCCN: 2009900515</identifier><language>eng</language><publisher>IEEE</publisher><subject>charging ; Conductors ; Electric variables measurement ; Electromagnetic compatibility ; Electrons ; Electrostatic measurements ; electrostatics ; Instruments ; matrixes ; Neodymium ; Particle measurements ; Plasma density ; Space charge</subject><ispartof>2009 9th International Conference on Electronic Measurement &amp; Instruments, 2009, p.1-436-1-439</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5274837$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5274837$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gefei Yu</creatorcontrib><title>Research on electrostatic between metallic particle and semiconductor matrixes</title><title>2009 9th International Conference on Electronic Measurement &amp; Instruments</title><addtitle>ICEMI</addtitle><description>By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. 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Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs 2 O of previous research. Ag-Cs 2 O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.</abstract><pub>IEEE</pub><doi>10.1109/ICEMI.2009.5274837</doi></addata></record>
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subjects charging
Conductors
Electric variables measurement
Electromagnetic compatibility
Electrons
Electrostatic measurements
electrostatics
Instruments
matrixes
Neodymium
Particle measurements
Plasma density
Space charge
title Research on electrostatic between metallic particle and semiconductor matrixes
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