Loading…
Research on electrostatic between metallic particle and semiconductor matrixes
By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between...
Saved in:
Main Author: | |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 1-439 |
container_issue | |
container_start_page | 1-436 |
container_title | |
container_volume | |
creator | Gefei Yu |
description | By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs 2 O of previous research. Ag-Cs 2 O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper. |
doi_str_mv | 10.1109/ICEMI.2009.5274837 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5274837</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5274837</ieee_id><sourcerecordid>5274837</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-e5b4fd929c7e35ba80381c629ad84f98810dd5a555de38b693f70a391e9f2a0e3</originalsourceid><addsrcrecordid>eNpFkN1KAzEUhCNS0Na-gN7kBXY9-esml1KqFqqC9L6cTc7iyv6UJKK-vSsWnJthPoa5GMauBZRCgLvdrjdP21ICuNLISltVnbG50FJrZVcazv-DkjM2_y06ACPMBVum9A6TtFHG6Ev2_EqJMPo3Pg6cOvI5jiljbj2vKX8SDbynjF03gSPGiXfEcQg8Ud_6cQgfPo-R95hj-0Xpis0a7BItT75g-_vNfv1Y7F4etuu7XdE6yAWZWjfBSecrUqZGC8oKv5IOg9WNs1ZACAaNMYGUrVdONRWgcoJcIxFILdjN32xLRIdjbHuM34fTF-oH_jdSCw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Research on electrostatic between metallic particle and semiconductor matrixes</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Gefei Yu</creator><creatorcontrib>Gefei Yu</creatorcontrib><description>By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs 2 O of previous research. Ag-Cs 2 O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.</description><identifier>ISBN: 1424438632</identifier><identifier>ISBN: 9781424438631</identifier><identifier>EISBN: 1424438640</identifier><identifier>EISBN: 9781424438648</identifier><identifier>DOI: 10.1109/ICEMI.2009.5274837</identifier><identifier>LCCN: 2009900515</identifier><language>eng</language><publisher>IEEE</publisher><subject>charging ; Conductors ; Electric variables measurement ; Electromagnetic compatibility ; Electrons ; Electrostatic measurements ; electrostatics ; Instruments ; matrixes ; Neodymium ; Particle measurements ; Plasma density ; Space charge</subject><ispartof>2009 9th International Conference on Electronic Measurement & Instruments, 2009, p.1-436-1-439</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5274837$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27924,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5274837$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gefei Yu</creatorcontrib><title>Research on electrostatic between metallic particle and semiconductor matrixes</title><title>2009 9th International Conference on Electronic Measurement & Instruments</title><addtitle>ICEMI</addtitle><description>By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs 2 O of previous research. Ag-Cs 2 O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.</description><subject>charging</subject><subject>Conductors</subject><subject>Electric variables measurement</subject><subject>Electromagnetic compatibility</subject><subject>Electrons</subject><subject>Electrostatic measurements</subject><subject>electrostatics</subject><subject>Instruments</subject><subject>matrixes</subject><subject>Neodymium</subject><subject>Particle measurements</subject><subject>Plasma density</subject><subject>Space charge</subject><isbn>1424438632</isbn><isbn>9781424438631</isbn><isbn>1424438640</isbn><isbn>9781424438648</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFkN1KAzEUhCNS0Na-gN7kBXY9-esml1KqFqqC9L6cTc7iyv6UJKK-vSsWnJthPoa5GMauBZRCgLvdrjdP21ICuNLISltVnbG50FJrZVcazv-DkjM2_y06ACPMBVum9A6TtFHG6Ev2_EqJMPo3Pg6cOvI5jiljbj2vKX8SDbynjF03gSPGiXfEcQg8Ud_6cQgfPo-R95hj-0Xpis0a7BItT75g-_vNfv1Y7F4etuu7XdE6yAWZWjfBSecrUqZGC8oKv5IOg9WNs1ZACAaNMYGUrVdONRWgcoJcIxFILdjN32xLRIdjbHuM34fTF-oH_jdSCw</recordid><startdate>200908</startdate><enddate>200908</enddate><creator>Gefei Yu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200908</creationdate><title>Research on electrostatic between metallic particle and semiconductor matrixes</title><author>Gefei Yu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-e5b4fd929c7e35ba80381c629ad84f98810dd5a555de38b693f70a391e9f2a0e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>charging</topic><topic>Conductors</topic><topic>Electric variables measurement</topic><topic>Electromagnetic compatibility</topic><topic>Electrons</topic><topic>Electrostatic measurements</topic><topic>electrostatics</topic><topic>Instruments</topic><topic>matrixes</topic><topic>Neodymium</topic><topic>Particle measurements</topic><topic>Plasma density</topic><topic>Space charge</topic><toplevel>online_resources</toplevel><creatorcontrib>Gefei Yu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gefei Yu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Research on electrostatic between metallic particle and semiconductor matrixes</atitle><btitle>2009 9th International Conference on Electronic Measurement & Instruments</btitle><stitle>ICEMI</stitle><date>2009-08</date><risdate>2009</risdate><spage>1-436</spage><epage>1-439</epage><pages>1-436-1-439</pages><isbn>1424438632</isbn><isbn>9781424438631</isbn><eisbn>1424438640</eisbn><eisbn>9781424438648</eisbn><abstract>By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs 2 O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs 2 O of previous research. Ag-Cs 2 O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.</abstract><pub>IEEE</pub><doi>10.1109/ICEMI.2009.5274837</doi></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISBN: 1424438632 |
ispartof | 2009 9th International Conference on Electronic Measurement & Instruments, 2009, p.1-436-1-439 |
issn | |
language | eng |
recordid | cdi_ieee_primary_5274837 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | charging Conductors Electric variables measurement Electromagnetic compatibility Electrons Electrostatic measurements electrostatics Instruments matrixes Neodymium Particle measurements Plasma density Space charge |
title | Research on electrostatic between metallic particle and semiconductor matrixes |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T09%3A38%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Research%20on%20electrostatic%20between%20metallic%20particle%20and%20semiconductor%20matrixes&rft.btitle=2009%209th%20International%20Conference%20on%20Electronic%20Measurement%20&%20Instruments&rft.au=Gefei%20Yu&rft.date=2009-08&rft.spage=1-436&rft.epage=1-439&rft.pages=1-436-1-439&rft.isbn=1424438632&rft.isbn_list=9781424438631&rft_id=info:doi/10.1109/ICEMI.2009.5274837&rft.eisbn=1424438640&rft.eisbn_list=9781424438648&rft_dat=%3Cieee_6IE%3E5274837%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-e5b4fd929c7e35ba80381c629ad84f98810dd5a555de38b693f70a391e9f2a0e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5274837&rfr_iscdi=true |