Multiport de-embedding technique for balanced varactor high frequency characterization

The present work proposes a simple Pad/Thru de-embedding method for multiport S-parameter measurements of differential varactors. The Pad/Thru method is compared to Open/Short de-embedding and leads to the following strengths: reduction of the wafer area required for dummy structure and reduction of...

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Bibliographic Details
Main Authors: Morandini, Y., Debroucke, R., Larchanche, J. F., Jan, S., Boret, S., Gloria, D., Pekarik, J.
Format: Conference Proceeding
Language:English
Subjects:
Atherosclerosis
characterization
CMOS technology
de-embedding
differential
Fingers
high frequency
Impedance
Measurement errors
muliport
Plugs
Probes
Radio frequency
Testing
varactor
Varactors
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Summary:The present work proposes a simple Pad/Thru de-embedding method for multiport S-parameter measurements of differential varactors. The Pad/Thru method is compared to Open/Short de-embedding and leads to the following strengths: reduction of the wafer area required for dummy structure and reduction of the number of measurements required to characterize and de-embed each devices.
DOI:10.23919/EUMC.2009.5296385