Loading…

Control-Oriented Hysteresis Models for Magnetic Electron Lenses

This paper deals with finding appropriate hysteresis models that predict the behavior of electro-magnetic lenses used with electron microscopy. The iterative selection procedure consists of experiment design and mathematical analysis of hysteresis models. We will show two examples of pitfalls when t...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on magnetics 2009-11, Vol.45 (11), p.5235-5238
Main Authors: van Bree, P.J., van Lierop, C.M.M., van den Bosch, P.P.P.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c428t-a5adcdabf20b2658730fe18d1d35b2cd7266d9218847b6a363f0cd4521f2fef23
cites cdi_FETCH-LOGICAL-c428t-a5adcdabf20b2658730fe18d1d35b2cd7266d9218847b6a363f0cd4521f2fef23
container_end_page 5238
container_issue 11
container_start_page 5235
container_title IEEE transactions on magnetics
container_volume 45
creator van Bree, P.J.
van Lierop, C.M.M.
van den Bosch, P.P.P.
description This paper deals with finding appropriate hysteresis models that predict the behavior of electro-magnetic lenses used with electron microscopy. The iterative selection procedure consists of experiment design and mathematical analysis of hysteresis models. We will show two examples of pitfalls when the suitability of models is assessed by means of curve-fitting to observations. The first example illustrates the inability of models with local memory to describe the magnetic hysteresis in our application. The second deals with accommodation. With both, the experiments carried out on an off-line setup of a magnetic lens are compared to hysteresis models.
doi_str_mv 10.1109/TMAG.2009.2031081
format article
fullrecord <record><control><sourceid>proquest_ieee_</sourceid><recordid>TN_cdi_ieee_primary_5297505</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5297505</ieee_id><sourcerecordid>869859504</sourcerecordid><originalsourceid>FETCH-LOGICAL-c428t-a5adcdabf20b2658730fe18d1d35b2cd7266d9218847b6a363f0cd4521f2fef23</originalsourceid><addsrcrecordid>eNp9kEFrGzEQhUVoIK6THxB6WQptTpvOaCWtdCrGOEnBJpf0LGRpVDZsdlNpfci_rxwbH3LoZYZhvveYeYxdI9wigvnxtFnc33IAU0qDoPGMzdAIrAGU-cRmAKhrI5S4YJ9zfi6jkAgz9nM5DlMa-_oxdTRMFKqHtzxRotzlajMG6nMVx1Rt3J-Bps5Xq558EQzVmoZM-ZKdR9dnujr2Oft9t3paPtTrx_tfy8W69oLrqXbSBR_cNnLYciV120Ak1AFDI7fch5YrFQxHrUW7Va5RTQQfhOQYeaTImzm7Ofi-pvHvjvJkX7rsqe_dQOMuW62MlkaCKOT3_5LFWykuoYBfP4DP4y4N5QurpSrHCIEFwgPk05hzomhfU_fi0ptFsPvk7T55u0_eHpMvmm9HY5e962Nyg-_yScg5ypa_X_rlwHVEdFpLbloJsvkHQsOKtQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>856921441</pqid></control><display><type>article</type><title>Control-Oriented Hysteresis Models for Magnetic Electron Lenses</title><source>IEEE Electronic Library (IEL) Journals</source><creator>van Bree, P.J. ; van Lierop, C.M.M. ; van den Bosch, P.P.P.</creator><creatorcontrib>van Bree, P.J. ; van Lierop, C.M.M. ; van den Bosch, P.P.P.</creatorcontrib><description>This paper deals with finding appropriate hysteresis models that predict the behavior of electro-magnetic lenses used with electron microscopy. The iterative selection procedure consists of experiment design and mathematical analysis of hysteresis models. We will show two examples of pitfalls when the suitability of models is assessed by means of curve-fitting to observations. The first example illustrates the inability of models with local memory to describe the magnetic hysteresis in our application. The second deals with accommodation. With both, the experiments carried out on an off-line setup of a magnetic lens are compared to hysteresis models.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.2009.2031081</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Accommodation ; Control systems ; Cross-disciplinary physics: materials science; rheology ; Curve fitting ; Electron microscopy ; Exact sciences and technology ; Experiment design ; Hysteresis ; Iterative methods ; Lenses ; limit cycles ; Magnetic electron lenses ; Magnetic field measurement ; Magnetic fields ; Magnetic flux ; Magnetic hysteresis ; Magnetic lenses ; Magnetism ; Materials science ; Mathematical analysis ; Mathematical model ; Mathematical models ; modeling ; Other topics in materials science ; Physics ; Predictive models ; time domain measurements</subject><ispartof>IEEE transactions on magnetics, 2009-11, Vol.45 (11), p.5235-5238</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c428t-a5adcdabf20b2658730fe18d1d35b2cd7266d9218847b6a363f0cd4521f2fef23</citedby><cites>FETCH-LOGICAL-c428t-a5adcdabf20b2658730fe18d1d35b2cd7266d9218847b6a363f0cd4521f2fef23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5297505$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=22157204$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>van Bree, P.J.</creatorcontrib><creatorcontrib>van Lierop, C.M.M.</creatorcontrib><creatorcontrib>van den Bosch, P.P.P.</creatorcontrib><title>Control-Oriented Hysteresis Models for Magnetic Electron Lenses</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>This paper deals with finding appropriate hysteresis models that predict the behavior of electro-magnetic lenses used with electron microscopy. The iterative selection procedure consists of experiment design and mathematical analysis of hysteresis models. We will show two examples of pitfalls when the suitability of models is assessed by means of curve-fitting to observations. The first example illustrates the inability of models with local memory to describe the magnetic hysteresis in our application. The second deals with accommodation. With both, the experiments carried out on an off-line setup of a magnetic lens are compared to hysteresis models.</description><subject>Accommodation</subject><subject>Control systems</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Curve fitting</subject><subject>Electron microscopy</subject><subject>Exact sciences and technology</subject><subject>Experiment design</subject><subject>Hysteresis</subject><subject>Iterative methods</subject><subject>Lenses</subject><subject>limit cycles</subject><subject>Magnetic electron lenses</subject><subject>Magnetic field measurement</subject><subject>Magnetic fields</subject><subject>Magnetic flux</subject><subject>Magnetic hysteresis</subject><subject>Magnetic lenses</subject><subject>Magnetism</subject><subject>Materials science</subject><subject>Mathematical analysis</subject><subject>Mathematical model</subject><subject>Mathematical models</subject><subject>modeling</subject><subject>Other topics in materials science</subject><subject>Physics</subject><subject>Predictive models</subject><subject>time domain measurements</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9kEFrGzEQhUVoIK6THxB6WQptTpvOaCWtdCrGOEnBJpf0LGRpVDZsdlNpfci_rxwbH3LoZYZhvveYeYxdI9wigvnxtFnc33IAU0qDoPGMzdAIrAGU-cRmAKhrI5S4YJ9zfi6jkAgz9nM5DlMa-_oxdTRMFKqHtzxRotzlajMG6nMVx1Rt3J-Bps5Xq558EQzVmoZM-ZKdR9dnujr2Oft9t3paPtTrx_tfy8W69oLrqXbSBR_cNnLYciV120Ak1AFDI7fch5YrFQxHrUW7Va5RTQQfhOQYeaTImzm7Ofi-pvHvjvJkX7rsqe_dQOMuW62MlkaCKOT3_5LFWykuoYBfP4DP4y4N5QurpSrHCIEFwgPk05hzomhfU_fi0ptFsPvk7T55u0_eHpMvmm9HY5e962Nyg-_yScg5ypa_X_rlwHVEdFpLbloJsvkHQsOKtQ</recordid><startdate>20091101</startdate><enddate>20091101</enddate><creator>van Bree, P.J.</creator><creator>van Lierop, C.M.M.</creator><creator>van den Bosch, P.P.P.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20091101</creationdate><title>Control-Oriented Hysteresis Models for Magnetic Electron Lenses</title><author>van Bree, P.J. ; van Lierop, C.M.M. ; van den Bosch, P.P.P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c428t-a5adcdabf20b2658730fe18d1d35b2cd7266d9218847b6a363f0cd4521f2fef23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Accommodation</topic><topic>Control systems</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Curve fitting</topic><topic>Electron microscopy</topic><topic>Exact sciences and technology</topic><topic>Experiment design</topic><topic>Hysteresis</topic><topic>Iterative methods</topic><topic>Lenses</topic><topic>limit cycles</topic><topic>Magnetic electron lenses</topic><topic>Magnetic field measurement</topic><topic>Magnetic fields</topic><topic>Magnetic flux</topic><topic>Magnetic hysteresis</topic><topic>Magnetic lenses</topic><topic>Magnetism</topic><topic>Materials science</topic><topic>Mathematical analysis</topic><topic>Mathematical model</topic><topic>Mathematical models</topic><topic>modeling</topic><topic>Other topics in materials science</topic><topic>Physics</topic><topic>Predictive models</topic><topic>time domain measurements</topic><toplevel>online_resources</toplevel><creatorcontrib>van Bree, P.J.</creatorcontrib><creatorcontrib>van Lierop, C.M.M.</creatorcontrib><creatorcontrib>van den Bosch, P.P.P.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) Online</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>van Bree, P.J.</au><au>van Lierop, C.M.M.</au><au>van den Bosch, P.P.P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Control-Oriented Hysteresis Models for Magnetic Electron Lenses</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>2009-11-01</date><risdate>2009</risdate><volume>45</volume><issue>11</issue><spage>5235</spage><epage>5238</epage><pages>5235-5238</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>This paper deals with finding appropriate hysteresis models that predict the behavior of electro-magnetic lenses used with electron microscopy. The iterative selection procedure consists of experiment design and mathematical analysis of hysteresis models. We will show two examples of pitfalls when the suitability of models is assessed by means of curve-fitting to observations. The first example illustrates the inability of models with local memory to describe the magnetic hysteresis in our application. The second deals with accommodation. With both, the experiments carried out on an off-line setup of a magnetic lens are compared to hysteresis models.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.2009.2031081</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0018-9464
ispartof IEEE transactions on magnetics, 2009-11, Vol.45 (11), p.5235-5238
issn 0018-9464
1941-0069
language eng
recordid cdi_ieee_primary_5297505
source IEEE Electronic Library (IEL) Journals
subjects Accommodation
Control systems
Cross-disciplinary physics: materials science
rheology
Curve fitting
Electron microscopy
Exact sciences and technology
Experiment design
Hysteresis
Iterative methods
Lenses
limit cycles
Magnetic electron lenses
Magnetic field measurement
Magnetic fields
Magnetic flux
Magnetic hysteresis
Magnetic lenses
Magnetism
Materials science
Mathematical analysis
Mathematical model
Mathematical models
modeling
Other topics in materials science
Physics
Predictive models
time domain measurements
title Control-Oriented Hysteresis Models for Magnetic Electron Lenses
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T15%3A50%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Control-Oriented%20Hysteresis%20Models%20for%20Magnetic%20Electron%20Lenses&rft.jtitle=IEEE%20transactions%20on%20magnetics&rft.au=van%20Bree,%20P.J.&rft.date=2009-11-01&rft.volume=45&rft.issue=11&rft.spage=5235&rft.epage=5238&rft.pages=5235-5238&rft.issn=0018-9464&rft.eissn=1941-0069&rft.coden=IEMGAQ&rft_id=info:doi/10.1109/TMAG.2009.2031081&rft_dat=%3Cproquest_ieee_%3E869859504%3C/proquest_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c428t-a5adcdabf20b2658730fe18d1d35b2cd7266d9218847b6a363f0cd4521f2fef23%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=856921441&rft_id=info:pmid/&rft_ieee_id=5297505&rfr_iscdi=true