Clocked storage elements robust to process variations

In this work, different types of clocked storage elements are compared in terms of the impact of process variations on their performances. Transistor sizes are obtained from energy-efficient characteristics and used in the simulation to measure the delay variations caused by process variations. The...

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Bibliographic Details
Main Authors: Joosik Moon, Aktan, M., Oklobdzija, V.G.
Format: Conference Proceeding
Language:English
Subjects:
Clocked storage elements
Clocks
Degradation
Design methodology
Design optimization
energy-delay tradeoff
energy-efficient characteristics
Helium
Microelectronics
Multicore processing
process variations
Random access memory
Robustness
Timing
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Summary:In this work, different types of clocked storage elements are compared in terms of the impact of process variations on their performances. Transistor sizes are obtained from energy-efficient characteristics and used in the simulation to measure the delay variations caused by process variations. The structure of a clocked storage element affects its robustness to process variations.
ISSN:2162-7541
2162-755X
DOI:10.1109/ASICON.2009.5351566