A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis

This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be eas...

Full description

Saved in:
Bibliographic Details
Main Authors: Barragan, M.J., Fiorelli, R., Vazquez, D., Rueda, A., Huertas, J.L.
Format: Conference Proceeding
Language:English
Subjects:
Analog BIST
Built-in self-test
CMOS technology
Costs
Envelope detectors
Proposals
Radio frequency
RF BIST
RF Test
System testing
System-on-a-chip
Test equipment
Transceivers
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2009.14