Temperature dependent photoluminescence process in ZnO thin films grown on quartz by sol-gel method

The optical properties of ZnO thin films grown by sol-gel method on quartz wafers were studied using photoluminescence measurements for optical properties. The structural properties of the ZnO thin films were carried out using X-ray method. The effects of the thickness variation and annealing temper...

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Bibliographic Details
Main Authors: Zawadzka, A., Plociennik, P., Lukasiak, Z., Bartkiewicz, K., Korcala, A.
Format: Conference Proceeding
Language:English
Subjects:
Annealing
Crystallization
exciton lifetime
Excitons
Optical films
Optical sensors
Photoluminescence
Temperature dependence
Temperature distribution
Transistors
Zinc oxide
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Summary:The optical properties of ZnO thin films grown by sol-gel method on quartz wafers were studied using photoluminescence measurements for optical properties. The structural properties of the ZnO thin films were carried out using X-ray method. The effects of the thickness variation and annealing temperature on the crystallinity parameters were observed. A strong dependence of the films structure, the crystalline quality and the optical properties was also observed.
DOI:10.1109/ICTONMW.2009.5385623