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Detecting Critical Nodes for Efficient Network Vulnerability Management

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Main Authors: Lee, Jinho, Yoon, Sungjin, Kim, Sunghak, Ahn, Seongjin
Format: Conference Proceeding
Language:English
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creator Lee, Jinho
Yoon, Sungjin
Kim, Sunghak
Ahn, Seongjin
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doi_str_mv 10.1109/CSA.2009.5404196
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identifier ISSN: 2159-7030
ispartof 2009 2nd International Conference on Computer Science and its Applications, 2009, p.1-6
issn 2159-7030
language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Complex networks
Computer network management
Computer networks
Computer science education
Telecommunication traffic
Testing
Tree graphs
Wireless communication
title Detecting Critical Nodes for Efficient Network Vulnerability Management
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